41. |
Nanofabrication of grating and dot patterns by electron holographic lithography |
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Applied Physics Letters,
Volume 66,
Issue 12,
1995,
Page 1560-1562
Keiko Ogai,
Yoshihide Kimura,
Ryuichi Shimizu,
Junichi Fujita,
Shinji Matsui,
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摘要:
Line and dot patterns with about a 100 nm period are exposed on poly‐methyl methacrylate (PMMA) resist by electron holographic lithography with a W〈100〉 thermal field emission (TFE) gun and an electron biprism. Subsequent atomic force microscope (AFM) observation has confirmed that both patterns are successfully fabricated. This technique allows one to produce nanoscale periodic patterns simultaneously, whose spacing could be, in principle, comparable to a lattice spacing. ©1995 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.113646
出版商:AIP
年代:1995
数据来源: AIP
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42. |
Micromechanical radiation dosimeter |
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Applied Physics Letters,
Volume 66,
Issue 12,
1995,
Page 1563-1565
T. Thundat,
S. L. Sharp,
W. G. Fisher,
R. J. Warmack,
E. A. Wachter,
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摘要:
We demonstrate the use of microcantilevers coated with ultraviolet cross‐linking polymers as optical radiation dosimeters. Upon exposure to radiation, a treated cantilever bends due to stress and its resonance frequency increases due to stiffening. These phenomena can be used to develop sensitive radiation dosimeters which respond to radiation affecting the mechanical properties of the selected coating.
ISSN:0003-6951
DOI:10.1063/1.113647
出版商:AIP
年代:1995
数据来源: AIP
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43. |
Erratum: ‘‘Electrical properties of oxides grown on strained SiGe layer at low temperatures in a microwave oxygen plasma’’ [Appl. Phys. Lett. 65, 895 (1994)] |
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Applied Physics Letters,
Volume 66,
Issue 12,
1995,
Page 1566-1566
M. Mukhopadhyay,
S. K. Ray,
C. K. Maiti,
D. K. Nayak,
Y. Shiraki,
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PDF (21KB)
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ISSN:0003-6951
DOI:10.1063/1.114225
出版商:AIP
年代:1995
数据来源: AIP
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