41. |
Properties of Schottky contacts of aluminum on strained Si1−x−yGexCylayers |
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Applied Physics Letters,
Volume 69,
Issue 24,
1996,
Page 3743-3745
Jian Mi,
Ashawant Gupta,
Cary Y. Yang,
Jintian Zhu,
Paul K. L. Yu,
Patricia Warren,
Michel Dutoit,
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摘要:
Schottky contacts of Al/Si1−x−yGexCywere fabricated using conventional Si technology. Effects of thermal processing of the alloys on the electrical properties of the Al/Si1−x−yGexCySchottky diodes were investigated. Current–voltage (I–V), capacitance–voltage (C–V), and x‐ray diffraction measurements were performed. These thick alloy films (100–150 nm) experienced strain relaxation upon annealing at 700 °C. Nearly idealI–VandC–Vbehaviors were obtained for strain‐compensated samples.I–VandC–Vcharacteristics show evidence of dislocation‐related traps for strain‐relaxed samples. Carbon incorporation improves theI–VandC–Vcharacteristics by lessening the extent of lattice relaxation due to thermal processing. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.117208
出版商:AIP
年代:1996
数据来源: AIP
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42. |
Controlled growth of bulk bicrystals and the investigation of microstructure‐property relations of YBa2Cu3Oxgrain boundaries |
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Applied Physics Letters,
Volume 69,
Issue 24,
1996,
Page 3746-3748
V. R. Todt,
X. F. Zhang,
D. J. Miller,
M. St. Louis‐Weber,
V. P. Dravid,
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摘要:
A new method to prepare bicrystals with well defined planar interfaces in YBa2Cu3Ox(Y123) has been developed. The bicrystal misorientation is controlled by dual seeding using Nd1+xBa2−xCu3Oysingle crystals. The grain boundary plane orientation is influenced by the positioning of the seeds and by control of the temperature gradient. The macro‐, meso‐, and microscopic planarity of the grain boundaries has been established by optical and electron microscopy. In addition, a difference in critical current density between the low (≤10°) and the high (≥20°) misorientation angle regime of nearly two orders of magnitude has been established in a series of [001]‐tilt grain boundaries. Thus, this type of grain boundary may allow a less ambiguous interpretation of the relationship between microstructure and transport properties than is possible from bicrystal thin film boundaries by eliminating the potential variations in properties associated with a varying grain boundary plane. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.117209
出版商:AIP
年代:1996
数据来源: AIP
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43. |
Measurement of rapidly varying electric fields through parity oscillations in the Rydberg states of hydrogenic atoms |
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Applied Physics Letters,
Volume 69,
Issue 24,
1996,
Page 3749-3751
N. E. Shafer‐Ray,
R. N. Zare,
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摘要:
Oscillations are shown to exist in the inversion symmetry of the electronic wave function of a hydrogenic atom coherently excited to a Rydberg state by a short pulse of laser radiation in a uniform electric field. The dependence of these oscillations on field strength is shown to scale asn2wherenis the principal quantum number. The possibility of using these oscillations to measure electric signals on picosecond timescales (terahertz frequencies) is suggested. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.117180
出版商:AIP
年代:1996
数据来源: AIP
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44. |
Nanometer‐scale recording on an organic‐complex thin film with a scanning tunneling microscope |
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Applied Physics Letters,
Volume 69,
Issue 24,
1996,
Page 3752-3753
L. P. Ma,
Y. L. Song,
H. J. Gao,
W. B. Zhao,
H. Y. Chen,
Z. Q. Xue,
S. J. Pang,
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摘要:
Nanometer‐scale recording on an organic‐complex thin film with a scanning tunneling microscope (STM) under ambient conditions is demonstrated. The recording marks are made by applying external voltage pulses between the tip and the highly ordered pyrolytic graphite substrate. A 30×30 nm2STM image with recorded marks is given. The average recorded mark is 1.3 nm in diameter, which corresponds to a data storage density of about 1013bits/cm2. The current–voltage characteristics measured by the STM show an insulator behavior for the unrecorded regions, and a conductor behavior for the recorded regions, which indicates that the data are recorded by local change of the electrical property of the films. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.117181
出版商:AIP
年代:1996
数据来源: AIP
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45. |
Nondestructive evaluation of the oxidation stresses through thermal barrier coatings using Cr3+piezospectroscopy |
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Applied Physics Letters,
Volume 69,
Issue 24,
1996,
Page 3754-3756
R. J. Christensen,
D. M. Lipkin,
D. R. Clarke,
K. Murphy,
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摘要:
The stresses in the aluminum oxide formed during high‐temperature oxidation of a bond‐coated superalloy are shown to be measurable through zirconia thermal barrier coatings. The basis for the measurements is the piezospectroscopic shift in theR‐line fluorescence (photoluminescence) from Cr3+impurities incorporated into the growing aluminum oxide scale. Measurements through the thermal barrier coating are feasible because (partially stabilized) zirconia coatings have some transparency at both the excitation and at fluorescence frequencies. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.117182
出版商:AIP
年代:1996
数据来源: AIP
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