| 41. |
Study of the leakage field of magnetic force microscopy thin‐film tips using electron holography |
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Applied Physics Letters,
Volume 68,
Issue 13,
1996,
Page 1865-1867
B. G. Frost,
N. F. van Hulst,
E. Lunedei,
G. Matteucci,
E. Rikkers,
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摘要:
Electron holography is applied for the study of the leakage field of thin‐film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area. ©1996 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.116039
出版商:AIP
年代:1996
数据来源: AIP
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| 42. |
Comment on ‘‘Iron diffusivity in silicon: Impact of charge state’’ [Appl. Phys. Lett.66, 860 (1995)] |
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Applied Physics Letters,
Volume 68,
Issue 13,
1996,
Page 1868-1869
T. Heiser,
A. Mesli,
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ISSN:0003-6951
DOI:10.1063/1.116040
出版商:AIP
年代:1996
数据来源: AIP
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| 43. |
Response to ‘‘Comment on ‘Iron diffusivity in silicon: Impact of charge state’ ’’ [Appl. Phys. Lett.68, 1868 (1996)] |
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Applied Physics Letters,
Volume 68,
Issue 13,
1996,
Page 1870-1871
Sergei Koveshnikov,
George Rozgonyi,
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ISSN:0003-6951
DOI:10.1063/1.116041
出版商:AIP
年代:1996
数据来源: AIP
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| 44. |
Comment on ‘‘Normal incidence second‐harmonic generation inL‐valley AlSb/GaSb/Ga1−xAlxSb/AlSb stepped quantum wells’’ [Appl. Phys. Lett.65, 2048 (1994)] |
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Applied Physics Letters,
Volume 68,
Issue 13,
1996,
Page 1872-1872
M. Zal&slash;uz˙ny,
V. Bondarenko,
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ISSN:0003-6951
DOI:10.1063/1.116125
出版商:AIP
年代:1996
数据来源: AIP
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| 45. |
Response to ‘‘Comment on ‘Normal incidence second‐harmonic generation inL‐valley AlSb/GaSb/Ga1−xAlxSb/AlSb stepped quantum wells’ ’’ [Appl. Phys. Lett.68, 1872 (1996)] |
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Applied Physics Letters,
Volume 68,
Issue 13,
1996,
Page 1873-1873
L. R. Ram‐Mohan,
J. R. Meyer,
H. Xie,
W. I. Wang,
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ISSN:0003-6951
DOI:10.1063/1.116126
出版商:AIP
年代:1996
数据来源: AIP
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