摘要:

Tl2Ba2Ca1Cu2Oxthin films have been grown on highly textured CeO2layers deposited ontoR‐plane sapphire substrates. The Tl2Ba2Ca1Cu2Oxfilms have critical temperature (Tc) values around 95 K and current density (Jc) values up to 8×104A/cm2. The films arec‐axis oriented even though we have identified the formation of a polycrystalline BaCe(Tl)O3layer by reaction between the buffer layer and the superconducting precursor during the thalliation process. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.114075

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

The effect of Cr doping of the Fe layer on the magnetoresistance and saturation field of epitaxial, sputter‐deposited Fe1−xCrx(001)/Cr(001) multilayers was examined. Films with a composition of 100 A˚ Cr/[14 A˚ Fe1−xCrx/8 A˚ Cr]50, wherexwas varied from 0 to 0.5, were deposited onto single crystal MgO(001). The room temperature magnetoresistance was constant at approximately 31% forx≤0.2 and decreased with higher Cr concentrations. The saturation field decreased linearly with increasing Cr concentration over the entire range. Doping the Fe layer with Cr results in anincreaseof the spin‐dependent scattering (&Dgr;&rgr;) for 0.1≤x≤0.2 and an increase in the sensitivity of these films for all Cr concentrations. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.114076

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

Raman scattering spectra are used to investigate LiF cluster‐based nanophase films. The experiments confirm the existence of multi‐order‐like Raman scattering and surface phonon modes. Good agreement is achieved between the observed spectral lines and the calculated results if the Raman scattering lines are attributed to an appropriate linear combination of primary modes and surface optical modes. The fine structure observed in the case of the smaller cluster has reflected the intensity of the cluster‐substrate interaction, which may result in the splitting of Raman peaks. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.114077

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

In this letter, a method to calibrate sensitivity for the three‐dimensional displacement ofX,Y, andZdirections by using the novel force curve, namely lateral force curve, as well as vertical force curve in atomic force/lateral force microscope (AFM/LFM) measurement is described. Furthermore, from quantized friction measurement based on the two‐dimensional stick–slip model, it is experimentally confirmed that this lateral force curve calibration is reasonable. ©1995 American Institute of Physics. 

ISSN:0003-6951    

DOI:10.1063/1.114078

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 nm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found. ©1995 American Institute of Physics. 

ISSN:0003-6951    

DOI:10.1063/1.114079

出版商:AIP    

年代:1995

数据来源: AIP