摘要:

Tensioned 1 &mgr;m nanocrystalline Terfenol‐D films on 50 &mgr;m Si substrates display a pronounced damping maximum at a magnetic field of about 1.5 kOe oriented perpendicular to the plane of the film. The phenomenon is critically dependent on the orientation of the magnetic field and is the result of a magnetomechanical instability in the Terfenol film. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.115344

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

Pulsed (&lgr;=248 nm, pulse width=20 ns) KrF‐excimer‐laser‐induced etching of La0.75Ca0.25MnOx(LCMO) thin films exhibiting giant magnetoresistance (GMR) has been studied. The variation of etch depth as a function of the number of laser pulses shows a linear dependence in the fluence range between 0.15 and 4 J cm−2. The threshold fluence for ablation is found to be 0.07 J cm−2. The photoetching process is seen to follow the Beer–Lambert’s relation based on a linear absorption model with an absorption length of 28.3 nm. The nanomorphology of the laser etched surface as revealed by atomic force microscopy shows significant improvement in the surface smoothness of the deposited films for etching at low energy densities (typically 0.17 J cm−2) and enhanced roughness at higher energy densities (typically 0.86 J cm−2). Changes in the resistivity and GMR effect due to laser treatment are also examined. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.115345

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

We have observed the Fraunhofer diffraction pattern of x‐rays exiting from the end face of a SiO2/polyimide/Si thin‐film waveguide. The measured angular intensity distributions are in excellent agreement with those calculated based on the dimensions and the refractive index profile of the guide. Our measurement confirms that, at the end face of the guide, the wavefront of a single guided mode is fully coherent in the direction normal to the guiding plane. This focused and transversely coherent x‐ray beam may be used as a source for coherence‐based experiments, such as x‐ray photon correlation spectroscopy. ©1995 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.115346

出版商:AIP    

年代:1995

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.115347

出版商:AIP    

年代:1995

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.115348

出版商:AIP    

年代:1995

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.115349

出版商:AIP    

年代:1995

数据来源: AIP

摘要:

ISSN:0003-6951    

DOI:10.1063/1.115350

出版商:AIP    

年代:1995

数据来源: AIP