摘要:

A monolithic polycapillary focusing optic was tested in the microbeam x-ray fluorescence system at the Oak Ridge Center for Manufacturing Technology. The optic was designed to cover a wide energy range from 4 keV to 20 keV. The focal spot size of the output beam at 17.4 keV (Mo K&agr;)was measured to be 21&mgr;m full width of half maximum. An average beam intensity of1.5×105photon/s/&mgr;m2was obtained at the focus for Mo K&agr;line using a 12 W microfocus x-ray source. This intensity is about 2400 times over that of a direct beam at 100 mm away from the x-ray source. The small, intense x-ray beam obtained was used to analyze and map the compositions of different elements in industrial samples. ©1997 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.120360

出版商:AIP    

年代:1997

数据来源: AIP

摘要:

In situx-ray photoelectron spectroscopy was used to determine the band alignments of the platinum toSrBi2Ta2O9contact. The interfaces were prepared by incremental evaporation of Pt onto a vacuum/O2annealed polycrystalline surface grown by the sol-gel method. The results track the development of the band alignments from the submonolayer to the thick metal-film regimes. The Fermi level to ferroelectric valence-band offset of the asymptotic full metal contact was found to be 2.9 eV. The contact was also clearly shown to be highly disrupted with a bismuth-platinum alloy forming at the interface. ©1997 American Institute of Physics.

ISSN:0003-6951    

DOI:10.1063/1.120402

出版商:AIP    

年代:1997

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.120403

出版商:AIP    

年代:1997

数据来源: AIP

ISSN:0003-6951    

DOI:10.1063/1.120405

出版商:AIP    

年代:1997

数据来源: AIP