| 51. |
An optimal magnetic tip configuration for magnetic-resonance force microscopy of microscale buried features |
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Applied Physics Letters,
Volume 73,
Issue 25,
1998,
Page 3778-3780
John A. Marohn,
Rau´l Fainchtein,
Doran D. Smith,
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摘要:
To date, magnetic-resonance force microscopes employing a magnetic-field gradient source mounted to a microcantilever have suffered from a deleterious dependence of the effective cantilever spring constant on the external magnetic field. A “magnet-on-tip” configuration is introduced in which this dependence has been decreased by at least 200 fold, making it feasible to perform arbitrary-sample micron-scale magnetic resonance force microscopy at very high magnetic field. Alternating-gradient cantilever magnetometry is used to quantify the effect and to prove that the existing model of the tip-field interaction is only qualitatively correct. A model is proposed which quantitatively describes the tip-field interaction in the traditional tip configuration. ©1998 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.122892
出版商:AIP
年代:1998
数据来源: AIP
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| 52. |
Analytical descriptions of the tapping-mode atomic force microscopy response |
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Applied Physics Letters,
Volume 73,
Issue 25,
1998,
Page 3781-3783
Lugen Wang,
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摘要:
The tapping-mode atomic force microscopy response has been analyzed by the Krylov–Bogolubov–Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4. ©1998 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.122893
出版商:AIP
年代:1998
数据来源: AIP
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| 53. |
A study of electron field emission as a function of film thickness from amorphous carbon films |
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Applied Physics Letters,
Volume 73,
Issue 25,
1998,
Page 3784-3786
R. D. Forrest,
A. P. Burden,
S. R. P. Silva,
L. K. Cheah,
X. Shi,
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摘要:
The electron field-emission properties of hydrogenated amorphous carbon and nitrogenated tetrahedral amorphous carbon thin films are examined by measuring the field-emission current as a function of the applied macroscopic electric field. The experimental results indicate the existence of an optimum film thickness for low-threshold electron field emission. The predictions of various emission models are compared to the experimental results. ©1998 American Institute of Physics.
ISSN:0003-6951
DOI:10.1063/1.122894
出版商:AIP
年代:1998
数据来源: AIP
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