1. |
Mechanism of electroluminescence in alkaline‐earth sulfides |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 551-553
Richard S. Crandall,
Preview
|
PDF (315KB)
|
|
摘要:
A novel use of a staircase voltage waveform shows that three light emission peaks can be produced with a unipolarity voltage pulse in alkaline‐earth‐sulfide electroluminescent devices. Two peaks following the voltage decrease demonstrate the following: Light can be produced at fields much below those required for hot‐electron effects. Activators are ionized when a field is applied. Recombination controls electroluminescence.
ISSN:0003-6951
DOI:10.1063/1.98131
出版商:AIP
年代:1987
数据来源: AIP
|
2. |
Noncritically phase‐matched sum frequency generation and image up‐conversion in KNbO3crystals |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 554-556
Jean‐Claude Baumert,
Peter Gu¨nter,
Preview
|
PDF (253KB)
|
|
摘要:
Tunable and continuous wave (cw) near infrared up‐conversion into the dark blue wavelength range (410–465 nm) has been achieved in KNbO3crystals using the nonlinear optical coefficientd32(&ohgr;1+&ohgr;2; &ohgr;1,&ohgr;2)=20.4 pm/V. High efficiencies have been reached due to the large nonlinearity and the possibility of temperature‐tuned noncritical 90° phase matching. Using a neodymium:yttrium aluminum garnet laser (1064.2 nm) as the signal source and a krypton laser (676.4 nm) as the pump source, a sum signal (413.6 nm) power of over 0.1 mW was reached at a pump power of only 26.2 mW. cw image up‐conversion into the blue wavelength range has been demonstrated using a noncritically phase‐matched configuration in the same crystals atT=−4 °C.
ISSN:0003-6951
DOI:10.1063/1.98132
出版商:AIP
年代:1987
数据来源: AIP
|
3. |
Iterative method for computing the inverse Abel transform |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 557-559
Pablo A. Vicharelli,
Walter P. Lapatovich,
Preview
|
PDF (300KB)
|
|
摘要:
A rapidly converging iterative method based on deconvolution techniques is proposed for the computation of the inverse Abel transform. The calculations only involve repeated applications of the forward Abel transform and no derivatives are needed. The iterative method is shown to be less susceptible to noise amplification when compared with other techniques.
ISSN:0003-6951
DOI:10.1063/1.98133
出版商:AIP
年代:1987
数据来源: AIP
|
4. |
Plasma enhanced chemical vapor deposition of fluorinated silicon nitride using SiH4‐NH3‐NF3mixtures |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 560-562
R. E. Livengood,
D. W. Hess,
Preview
|
PDF (360KB)
|
|
摘要:
Fluorinated silicon nitride films are deposited by the plasma enhanced reaction of SiH4‐NH3‐NF3gas mixtures. The deposition rate with NF3increases to a maximum of approximately six times that of SiNxHydeposited using only SiH4and NH3. Optical and electrical properties of the SiNxHyfilms are also affected. The addition of NF3to the deposition atmosphere significantly reduces the concentration of H bonded to Si. The films display dielectric properties similar to SiNxHyfilms deposited using SiH4and NH3. All films containing F hydrolyze on exposure to air. When less than 10 at. % F is present in the as‐deposited films, film stability is achieved after initial hydrolysis. Essentially total hydrolysis to SiO2occurs when the F content exceeds 10 at. %.
ISSN:0003-6951
DOI:10.1063/1.98134
出版商:AIP
年代:1987
数据来源: AIP
|
5. |
Growth and dissolution of oxide films during laser‐assisted combustion of Ti and Zr |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 563-565
I. Ursu,
I. N. Mihailescu,
L. C. Nistor,
V. S. Teodorescu,
A. M. Prokhorov,
V. I. Konov,
V. G. Ralchenko,
Preview
|
PDF (347KB)
|
|
摘要:
cw CO2laser‐assisted combustion of Ti and Zr in Xe:O2and N2:O2gaseous mixtures was studied. Total dissolution of oxide films and/or formation of oxynitride layers on both metals were evidenced and the growth of giant oxide nuclei of up to 100×10×10 &mgr;m3was observed upon burning Zr samples.
ISSN:0003-6951
DOI:10.1063/1.98135
出版商:AIP
年代:1987
数据来源: AIP
|
6. |
Differential scanning calorimetry study of solid‐state amorphization in multilayer thin‐film Ni/Zr |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 566-568
R. J. Highmore,
J. E. Evetts,
A. L. Greer,
R. E. Somekh,
Preview
|
PDF (280KB)
|
|
摘要:
Differential scanning calorimetry (DSC) has been used to study solid‐state amorphization and subsequent crystallization in sputtered multilayer Ni/Zr thin films. Initial results provide quantitative information about the thermodynamics and kinetics of these processes. An analysis of DSC data enables the activation energy and pre‐exponential factor for interdiffusion of Ni and Zr ina‐NiZr to be found.
ISSN:0003-6951
DOI:10.1063/1.98136
出版商:AIP
年代:1987
数据来源: AIP
|
7. |
Scanning tunneling microscope as a micromechanical tool |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 569-570
M. A. McCord,
R. F. W. Pease,
Preview
|
PDF (318KB)
|
|
摘要:
The need to fashion materials on a submicron scale is now well recognized. In a scanning tunneling microscope we have been able to achieve nanometer scale control of the depth of penetration of the probe into a thin insulating film, and by laterally traversing the probe we have been able to machine away submicron‐wide, 20‐nm‐thick strips of the insulating film without damage to the substrate or probe. This could represent a new approach to ultrafine machining. However, the detailed mechanism of how the tunneling current through the film can be used to control the machining depth is still unclear.
ISSN:0003-6951
DOI:10.1063/1.98137
出版商:AIP
年代:1987
数据来源: AIP
|
8. |
Chemical effects in ion mixing of a ternary system (metal‐SiO2) |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 571-573
T. Banwell,
M‐A. Nicolet,
T. Sands,
P. J. Grunthaner,
Preview
|
PDF (343KB)
|
|
摘要:
The mixing of Ti, Cr, and Ni thin films with SiO2by low‐temperature (−196–25 °C) irradiation with 290 keV Xe has been investigated. Comparison of the morphology of the intermixed region and the dose dependences of net metal transport into SiO2reveals that long range motion and phase formation probably occur as separate and sequential processes. Kinetic limitations suppress chemical effects in these systems during the initial transport process. Chemical interactions influence the subsequent phase formation.
ISSN:0003-6951
DOI:10.1063/1.98138
出版商:AIP
年代:1987
数据来源: AIP
|
9. |
Detection and measurement of local distortions in a semiconductor layered structure by convergent‐beam electron diffraction |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 574-576
D. M. Maher,
H. L. Fraser,
C. J. Humphreys,
R. V. Knoell,
J. C. Bean,
Preview
|
PDF (409KB)
|
|
摘要:
It is shown thatlocaltetragonal distortion in a Si Ge0.05Si0.95strained‐layered structure can be detected and quantified from analyses of the high‐order Laue zone lines which are present in the bright‐field disks of [001] convergent‐beam electron diffraction patterns. The detection of a tetragonal distortion is based on symmetry arguments, whereas the quantification requires a detailed analysis which is based on computer simulated patterns, assuming a kinematical approximation of the scattering process and including surface relaxation. The result of this quantitative analysis is in good agreement with the tetragonal distortion which is predicted by isotropic elasticity theory.
ISSN:0003-6951
DOI:10.1063/1.98139
出版商:AIP
年代:1987
数据来源: AIP
|
10. |
Formation of submicron epitaxial islands of Pd2Si on silicon |
|
Applied Physics Letters,
Volume 50,
Issue 10,
1987,
Page 577-579
C. B. Boothroyd,
W. M. Stobbs,
K. N. Tu,
Preview
|
PDF (449KB)
|
|
摘要:
It has been found that annealing Pd‐Er deposits on a (001) silicon surface results in the formation of isolated submicron islands of Pd2Si with two epitaxially oriented habits. By contrast, when Pd is annealed on a (111) silicon substrate, Pd2Si is formed with full coverage and a specific epitaxy.
ISSN:0003-6951
DOI:10.1063/1.98140
出版商:AIP
年代:1987
数据来源: AIP
|