1. |
Observation of electroluminescence of ZnS:TbF3under various gaseous atmospheres |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2181-2182
Tsuyoshi Arakawa,
Nobuya Suezawa,
Gin‐ya Adachi,
Jiro Shiokawa,
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摘要:
The intensity of the electroluminescence (EL) of ZnS:TbF3changed after gas adsorption. The threshold voltage of EL after gas adsorption is correlated to the specific dielectric constant of adsorbates.
ISSN:0003-6951
DOI:10.1063/1.98932
出版商:AIP
年代:1987
数据来源: AIP
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2. |
Large third‐order optical nonlinearity of the organic metal &agr;‐[bis(ethylenedithio) tetrathiofulvalene] triiodide |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2183-2185
P. G. Huggard,
W. Blau,
D. Schweitzer,
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摘要:
The organic metal &agr;‐[bis(ethylenedithio) tetrathiofulvalene]2I3shows a large third‐order optical nonlinearity around 650 nm, as observed by forward degenerate four‐wave mixing. Nonlinear susceptibilities of ‖&khgr;(3)‖ ∼5×10−8esu are observed along the direction of maximum conductivity. The frequency dispersion of the nonlinearity points to a plasma effect due to the conduction electrons.
ISSN:0003-6951
DOI:10.1063/1.98933
出版商:AIP
年代:1987
数据来源: AIP
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3. |
Promethium‐doped phosphate glass laser at 933 and 1098 nm |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2186-2188
W. F. Krupke,
M. D. Shinn,
T. A. Kirchoff,
C. B. Finch,
L. A. Boatner,
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摘要:
A promethium (Pm3+) laser has been demonstrated for the first time. Trivalent promethium 147 doped into a lead‐indium‐phosphate glass e´talon was used to produce room‐temperature four‐level laser emission at wavelengths of 933 and 1098 nm. Spectroscopic and kinetic measurements have shown that Pm3+is similar to Nd3+as a laser active ion.
ISSN:0003-6951
DOI:10.1063/1.98934
出版商:AIP
年代:1987
数据来源: AIP
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4. |
One‐step two‐level etching technique for monolithic integrated optics |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2189-2191
W. J. Grande,
W. D. Braddock,
J. R. Shealy,
C. L. Tang,
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摘要:
We describe a one‐step two‐level etching technique for the batch fabrication of monolithically integrated optical circuits. The ability to fabricate high‐quality laser devices with this process is demonstrated.
ISSN:0003-6951
DOI:10.1063/1.98935
出版商:AIP
年代:1987
数据来源: AIP
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5. |
Generation of blue cw coherent radiation by sum frequency mixing in KTiOPO4 |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2192-2194
J.‐C. Baumert,
F. M. Schellenberg,
W. Lenth,
W. P. Risk,
G. C. Bjorklund,
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摘要:
The wavelength, angle, and temperature tolerances of a new room‐temperature noncritically phase‐matched frequency mixing process involving type II frequency mixing of 1064 and 809 nm radiation in potassium titanyl phosphate (KTiOPO4) are measured. The angular and temperature bandwidths are found to be unusually wide. Device applications for upconversion of diode pumped neodymium:yttrium aluminum garnet laser sources to the blue spectral region are explored.
ISSN:0003-6951
DOI:10.1063/1.98936
出版商:AIP
年代:1987
数据来源: AIP
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6. |
Neutron production from a shell‐confined carbon‐deuterium plasma by 1.06 &mgr;m laser irradiation |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2195-2196
Hiroyuki Daido,
Masanobu Yamanaka,
Kunioki Mima,
Katsunobu Nishihara,
Sadao Nakai,
Yoneyoshi Kitagawa,
Eisuke Miura,
Chiyoe Yamanaka,
Akira Hasegawa,
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摘要:
We demonstrate for the first time the production of more than 108neutrons per shot from a carbon‐deuterium plasma confined in a 100‐&mgr;m‐thick gold shell without an implosion using six beams from a GEKKO XII glass laser system at a laser wavelength of 1.06 &mgr;m. The equivalent neutron of the deuterium‐tritium reaction is estimated to be 1010–1011.
ISSN:0003-6951
DOI:10.1063/1.98937
出版商:AIP
年代:1987
数据来源: AIP
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7. |
Activation energy for thermal donor formation in silicon |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2197-2199
M. Claybourn,
R. C. Newman,
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摘要:
Czochralski silicon samples have been heated for increasing periods of time at temperatures of 395, 415, 450, 475, and 490 °C. At each stage infrared spectra of the electronic absorption of thermal donors TD2–TD9 were obtained with the samples at 4.2 K. The data for all the thermal donor centers can be presented on one universal plot, provided the concentration and time axes are simply scaled by factors that depend only on the temperature of heating. It is implied that the rate of formation of each center is limited by the same mechanism. An activation energy of 1.7±0.1 eV is determined for these processes.
ISSN:0003-6951
DOI:10.1063/1.98938
出版商:AIP
年代:1987
数据来源: AIP
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8. |
Thermal resistance at interfaces |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2200-2202
E. T. Swartz,
R. O. Pohl,
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摘要:
We report measurements of the solid‐solid thermal boundary resistanceRbd, spanning the temperature range from 1 to 300 K. Below 30 K,Rbdis found to be in agreement with the prediction of the acoustic mismatch model. The influence of diffuse scattering at the interface is found to have a very minor influence onRbd. Above 30 K,Rbddecreases less rapidly with increasing temperature than predicted by the theory. Phonon scattering in thin (∼30 A˚) disordered layers near the interface is shown to be a possible explanation. Implications for heat removal from integrated circuits are discussed.
ISSN:0003-6951
DOI:10.1063/1.98939
出版商:AIP
年代:1987
数据来源: AIP
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9. |
Aerosol jet etching of fine patterns |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2203-2205
Y. L. Chen,
J. R. Brock,
I. Trachtenberg,
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摘要:
Successful demonstration of a new etching technique, aerosol jet etching (AJE), is reported. AJE has been used to pattern fine lines with good anisotropy in silicon dioxide surfaces on silicon substrates using a hydrofluoric acid ultrafine aerosol jet.
ISSN:0003-6951
DOI:10.1063/1.98940
出版商:AIP
年代:1987
数据来源: AIP
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10. |
Interaction between radiation‐induced defects and the Pt‐related center in silicon |
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Applied Physics Letters,
Volume 51,
Issue 26,
1987,
Page 2206-2207
Y. M. Weng,
E. Ohta,
M. Sakata,
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摘要:
The interaction of Pt with electron irradiation induced defects has been observed. Platinum in silicon increases irradiation‐induced defects remarkably, especially of theAcenter, and lowers the annealing temperature to 220–140 °C for theAandEcenters, respectively. The levelEa(0.23) in the Pt‐doped silicon is the Pt(−/0) level, an acceptor like theAcenter.
ISSN:0003-6951
DOI:10.1063/1.98941
出版商:AIP
年代:1987
数据来源: AIP
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