| 1. |
EFFECT OF GROUND STATE ESR SATURATION ON RUBY LASER OUTPUT AT 90°K |
| |
Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 289-290
A. Szabo,
T. Igarashi,
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ISSN:0003-6951
DOI:10.1063/1.1754263
出版商:AIP
年代:1965
数据来源: AIP
|
| 2. |
CW HIGH‐POWER CO2&sngbnd;N2&sngbnd;He LASER |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 290-292
C. K. N. Patel,
P. K. Tien,
J. H. McFee,
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ISSN:0003-6951
DOI:10.1063/1.1754264
出版商:AIP
年代:1965
数据来源: AIP
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| 3. |
THERMAL SPIKES IN SUPERCONDUCTING THIN FILMS OF Sn AND In |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 292-294
Donald E. Spiel,
R. W. Boom,
E. C. Crittenden,
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ISSN:0003-6951
DOI:10.1063/1.1754265
出版商:AIP
年代:1965
数据来源: AIP
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| 4. |
INFRARED LASER OSCILLATION IN HBr AND HI GAS DISCHARGES |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 294-296
S. M. Jarrett,
J. Nunez,
G. Gould,
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ISSN:0003-6951
DOI:10.1063/1.1754266
出版商:AIP
年代:1965
数据来源: AIP
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| 5. |
HARMONIC GENERATION OF MICROWAVES PRODUCED BY A FIELD‐EMISSION CATHODE IN A SUPERCONDUCTING CAVITY |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 297-298
H. Zimmer,
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ISSN:0003-6951
DOI:10.1063/1.1754267
出版商:AIP
年代:1965
数据来源: AIP
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| 6. |
IMPROVED STABILITY OF FIELD‐EMISSION CURRENT AT MICROWAVE FREQUENCIES |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 298-300
H. Zimmer,
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PDF (188KB)
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ISSN:0003-6951
DOI:10.1063/1.1754268
出版商:AIP
年代:1965
数据来源: AIP
|
| 7. |
PLASMA RESONANCES AS A DIAGNOSTIC METHOD |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 300-302
P. Caldirola,
V. Agnello,
U. Finzi,
M. Fontanesi,
E. Sindoni,
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ISSN:0003-6951
DOI:10.1063/1.1754269
出版商:AIP
年代:1965
数据来源: AIP
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| 8. |
DISLOCATION CONTRAST IN ANOMALOUS TRANSMISSION X‐RAY TOPOGRAPHS OF Si |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 302-304
E. D. Jungbluth,
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ISSN:0003-6951
DOI:10.1063/1.1754270
出版商:AIP
年代:1965
数据来源: AIP
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| 9. |
OBSERVATIONS BY X‐RAY TOPOGRAPHY OF DISLOCATION STRESS FIELDS IN Si GENERATED BY ELECTRON‐BEAM BOMBARDMENT |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 304-306
Gene J. Carron,
L. K. Walford,
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ISSN:0003-6951
DOI:10.1063/1.1754271
出版商:AIP
年代:1965
数据来源: AIP
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| 10. |
DIFFUSION‐INDUCED DEFECTS IN THIN SILICON FILMS |
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Applied Physics Letters,
Volume 7,
Issue 11,
1965,
Page 306-308
M. L. Joshi,
B. J. Masters,
S. Dash,
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PDF (329KB)
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ISSN:0003-6951
DOI:10.1063/1.1754272
出版商:AIP
年代:1965
数据来源: AIP
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