ISSN:0278-4491    

DOI:10.1002/ep.3300160402

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

ISSN:0278-4491    

DOI:10.1002/ep.3300160403

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

ISSN:0278-4491    

DOI:10.1002/ep.3300160406

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

ISSN:0278-4491    

DOI:10.1002/ep.3300160408

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

ISSN:0278-4491    

DOI:10.1002/ep.3300160409

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

ISSN:0278-4491    

DOI:10.1002/ep.3300160410

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

摘要:

AbstractThere is a great deal of information about physical properties available to engineers. The trick is in knowing where to find what is needed when it is needed. Many of the widely available sources lack information that is needed for process design. Material Safety Data Sheets (MSDSs) include relatively little physical properties data and no transport properties. Standard references likePerry's Chemical Engineer's Handbook, the CRCHandbook of Chemistry and Physics, andLange's Handbook of Chemistrymay not have data for a particular property or compound.The handbooks have information about hydrocarbons, and some of the common industrial alcohols, ketones, and esters. Data on some common industrial solvents, such as the glycol ethers and their acetates, is rather sketchy in the classic manuals. What can an engineer do if there is a need for data not available in the common references?For example, USEPA published several guidance manuals that present cost estimating techniques for air pollution control equipment. Engineers working in industry and for regulatory agencies apply the guidance in these manuals in trying to determine whether any of several control options represent the Best Available Control Technology (BACT) for an emissions source. BACT is the maximum level of control, considering economic factors as well as pollutant removal.Even the simplified design procedures in USEPA'sControl Technology for Hazardous Air Pollutantsrequire information that is just not found on an MSDS. Incinerator operating cost estimates depend on the heat available from the pollutants, the heat of combustion. The sizing and cost estimating procedure for refrigerated condensers calls for vapor pressure data, the heat of vaporization, and the heat capacity (specific heat). A cost estimate for an absorption system to scrub air pollutants demands vapor‐liquid equilibrium information, diffusivities, and the pollutant molar volume.Instead of starting a game of phone tag with the vendor's customer service department or spending several hundred dollars for a reference book you may not need again for five years, why not try estimating techniques for physical properties? These techniques have been around for a long time and offer reasonable accuracy within their limits. Estimated values are certainly accurate enough for budgetary‐quote‐level design procedures.More accurate estimating techniques are available [3]. The drawback to more sophisticated methods is increased complexity. Often, the more precise estimate calls for a multi‐step calculation, with several adjustable parameters. The methods described here are fairly simple, either empirical formulas or group contribution

ISSN:0278-4491    

DOI:10.1002/ep.3300160411

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

摘要:

AbstractMotorola has traditionally focused on cost, yield, performance, and logistics as primary drivers for decision‐making. In the semiconductor industry, environmental issues have resulted in major modifications of tools and process steps because they are not routinely considered when making process design and manufacturing choices, nor is their impact on cost, yield, and cycle time. Certain business driving forces, such as cost, sustainability of processes/tools, time to market, market access, and market share, are leading Motorola to a cultural change in which environmental impacts must be considered during product and process design; however, design and process engineers have not been able to adequately address these impacts. Motorola's Advanced Process Research and Development Laboratory (APRDL) in the Semiconductor Product Sector (SPS) has recognized this and has established its own environmental group (separate from the site environmental compliance group) to implement a Design for Environmental (DFE) strategy. This group works with several project teams to address environmental issues in process development. To empower engineers to consider the environmental impacts of their materials and processes at the earliest possible stage, the APRDL environmental group has also developed a DFE training course. This web‐based course targets semiconductor design and process engineers and is available through Motorola University, the corporate training institution.In the broadest terms, DFE is a systematic management approach for evaluating and mitigating environmental concerns at the earliest possible stages of process design or product life cycle. It includes ongoing evaluation during the product life cycle, while optimizing the balance between environmental priorities and factors such as cost, yield, cycle time, performance, etc. This optimization requires that Motorola make value judgments based on the best information available. The course is designed to provide semiconductor engineers with the neccesary background to understand the concepts of DFE and the tools to incorporate consideration for environmental impacts into their daily routine with‐qut adding a significant burden to their wor

ISSN:0278-4491    

DOI:10.1002/ep.3300160412

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

摘要:

AbstractThe development, selection, and implementation of technologies to be used in removing cesium from radioactive liquid wastes in preparation for their final disposition is discussed.The methodology involved testing several proposed sorbents in ion‐exchange columns using actual liquid wastes from underground storage tanks at U.S. Department of Energy sites. The sorbents initially tested included resorcinolformaldehyde resin (RF), CS‐100 resin, SuperLig 644C resin, 3M WEB with embedded SuperLig 644, granular potassium cobalt hexacyanoferrate, and granular crystalline silicotitanates (CSTs).The results of the bench‐scale testing were used to select the sorbent for the full‐scale Cesium Removal Demonstration Project (CsRD). This project will treat up to 25,000 gal of radioactive supernatant stored in the Melton Valley Storage Tanks (MVSTs) at Oak Ridge National Laboratory (ORNL). The demonstration system is modular in design and will process supernatant at flows up to 5 gal/min through 12‐in.‐diam columns. Following the demonstration the system will be used for routine processing of tank waste at ORNL.To show their applicability to wastes at other sites, RF and CST sorbents were tested in a bench‐scale column using a diluted Hanford supernatant liquor (double‐shell slurry feed) from tank 241‐AW‐101. The results are compared with those from tests

ISSN:0278-4491    

DOI:10.1002/ep.3300160413

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY

摘要:

AbstractThis paper summarizes the benefits and risks associated with water re‐use and recycling in the semiconductor industry. The specific items that will be covered in this paper are: characterization of the spent rinse‐water types, the composition range of key impurities, different recycling strategies, and water conservation methods. Discussion will include the development of new purification methods for the removal of organic impurities, and the development of a computer model for simulating the effects of recy

ISSN:0278-4491    

DOI:10.1002/ep.3300160414

出版商:American Institute of Chemical Engineers    

年代:1997

数据来源: WILEY