摘要:

Recent developments in thin film technology have made it possible to construct multilayered thin film structures that act as efficient Bragg diffractors for x‐rays and extreme ultraviolet (EUV) radiation (see papers by Barbee and by Spiller, these proceedings). These structures, analogous to multilayered interference filters for the visible region of the spectrum, have important potential applications in many areas of x‐ray/EUV instrumentation. In this paper the theory of x‐ray diffraction by multilayer structures is briefly outlined, and approximate formulae for estimating their performance presented. A more complete computation scheme based on an ‘‘optical’’ model of multilayers is described, an it is shown how this approach can be modified to take account of imperfections in the structure and to compute the properties of nonperiodic structure. Finally, a comparison with some experimental results is presented.

ISSN:0094-243X    

DOI:10.1063/1.33164

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

The differences in form and specifications of optical components used in the visible an X‐ray spectral regions have stimulated the development of different approaches to the measurement of the latter. In general, the grazing incidence configuration is less conducive to the employment of the traditional interferometric methods of measurement than the automated probe methods which are now being developed. Optical methods become increasingly more valuable and more easily interpretable, the closer the optic approaches perfection.

ISSN:0094-243X    

DOI:10.1063/1.33165

出版商:AIP    

年代:1981

数据来源: AIP

ISSN:0094-243X    

DOI:10.1063/1.33166

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

In slightly less than twenty years, from its birth in 1962, X‐ray astronomy has developed into a major branch of astronomy, equalling in importance the more established disciplines for the study of astrophysical problems. This has resulted from two major technological advances: 1) the capability of placing into space, above the Earth’s attenuating atmosphere, large and sophisticated scientific payloads, and 2) the development of high resolution X‐ray imaging optics and associated detectors. This paper illustrates the rapid development of X‐ray imaging optics and discusses their application to astrophysical observations, both solar and non‐solar. In conjunction with various spectroscopic techniques, X‐ray telescopes are being used for astrophysical plasma diagnostics, obtainig elemental abundances, temperatures, and densities. Several examples are given. Further advances in X‐ray imaging optics will require the development of new metrology techniques in order to determine and control mirror figure and scattering. Future programs are discussed.

ISSN:0094-243X    

DOI:10.1063/1.33153

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

X‐ray optics stands on the threshold of realizing its early promise: precision analysis of microstructure on the scale of the x‐ray wavelength. The achievement of this exciting goal will depend in large part on advances in microfabrication technology making possible the precision fabrication of periodic microstructures. A review of recent advances in, as well as future prospects for: x‐ray microscopy, coded imaging, and space‐time resolved spectroscopy, resulting from improved microstructure fabrication capabilities is presented.

ISSN:0094-243X    

DOI:10.1063/1.33154

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

A paper was presented which reviewed the techniques of microlithography, etching, deposition and plating that are used to fabricate diffractive optical elements for the soft x‐ray region. Here a brief summary and a guide to some of the recent literature, which contains details of fabrication and applications, are provided.

ISSN:0094-243X    

DOI:10.1063/1.33155

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

For soft X‐ray microscopy the wavelength range of about 1−5 nm is best suited. The main applications of X‐ray microscopy are in the field of biology. The reason is that thick (1−10 &mgr;m) biological specimens in a natural state can be investigated. X‐ray microscopy requires intense X‐ray sources as well as high resolution X‐ray lenses. Suited X‐ray lenses are Fresnel zone plates.

ISSN:0094-243X    

DOI:10.1063/1.33156

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

The localized diagnostis of high density pellet plasmas of extremely short duration provides a primary incentive for the development of x‐ray lasers offering penetrating radiation in a collimated probe beam. The laser‐produced plasma will quite likely provide the best lasant medium for such a source. Coherence will enhance the usefulness for plasm diagnostics. Progress in the research devoted to developing such x‐ray lasers is described here as pertaining to essentially single‐electron ions. Following a brief overview of current activities in this area of research, a simple analysis is developed which is of value for defining a useful parameter regime. Measured gain coefficients for C5+are compared to an analytical model for electron‐capture pumping and found to be in good agreement. Preliminary data on aluminum appear promising for shorter wavelength extrapolation. Extension of the illustrative analysis provides directions for future quantitative measurements leading to large scale gain experiments.

ISSN:0094-243X    

DOI:10.1063/1.33167

出版商:AIP    

年代:1981

数据来源: AIP

ISSN:0094-243X    

DOI:10.1063/1.33168

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

A review of the various types of x‐ray interferometers is given, and their characteristis and relative merits discussed. Some of their current applications are described and some possible future ones outlined.

ISSN:0094-243X    

DOI:10.1063/1.33169

出版商:AIP    

年代:1981

数据来源: AIP