摘要:

Uranium total attenuation coefficients were measured continuously from 0.84 to 6.0 keV and at selected higher energies using a vacuum single crystal diffractometer and flow‐proportional counter. Statistical fluctuations ranged from 0.5% to 2%. The overall accuracy was 3%. Prominent structure was measured within 20 eV of theM5(3.552 keV) andM4(3.728 keV) edges. Jump ratios were determined from log‐log polynomial fits to data at energies apart from the near‐edge regions. These data were compared with calculations based on a relativistic HFS central potential model and with previously tabulated data.

ISSN:0094-243X    

DOI:10.1063/1.33135

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

An epoxy replica of a test piece designed to simulte a Wolter x‐ray microscope geometry showed no loss of x‐ray refletivity or resolution, compared to the original. The test piece was a diamond‐turned cone with 1.5° half angle. A flat was fly‐cut on one side, then super‐ and conventionally polished. The replica was separated at the 1.5°‐draft angle, simulating a shallow angle Wolter microscope geometry. A test with 8.34 A˚ x rys at 0.9° grazing angle showed a reflectivity of 67% for the replica flat surface, and 70% for the original. No spread of the refleted beam was observed with a 20‐arc second wide test beam. This test verifies the epoxy replication technique for production of Wolter x‐ray microscopes.

ISSN:0094-243X    

DOI:10.1063/1.33137

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

Two separate diffractors are employed in a crossed configuration to achieve two‐dimensional spectral imaging. The crossed crystal concept is here generalized to apply to either Bragg case (surface) or Laue case (transmission) diffractors which may undergo either symmetric or asymmetric diffraction, and which may be crystals, pseudocrystals, or multilayers, and may be flat or curved. The crossed crystal spectrograph offers wide selection of 2dspacings, crystalRvalues, resolutions, polarization losses, wavelengths, and magnifications.

ISSN:0094-243X    

DOI:10.1063/1.33138

出版商:AIP    

年代:1981

数据来源: AIP

摘要:

Simultaneous X‐ray reflections are used to obtain monochromatic images from a laser produced plasma. Wavelength range and wavelength resolution are being discussed.

ISSN:0094-243X    

DOI:10.1063/1.33139

出版商:AIP    

年代:1981

数据来源: AIP

ISSN:0094-243X    

DOI:10.1063/1.33140

出版商:AIP    

年代:1981

数据来源: AIP

ISSN:0094-243X    

DOI:10.1063/1.33141

出版商:AIP    

年代:1981

数据来源: AIP