51. |
Scanning Probe Microscopies (SXM) in Biology: Facts and Fictions |
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AIP Conference Proceedings,
Volume 241,
Issue 1,
1991,
Page 544-546
W. Baumeister,
E. Zeitler,
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PDF (175KB)
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ISSN:0094-243X
DOI:10.1063/1.41400
出版商:AIP
年代:1991
数据来源: AIP
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52. |
Scanned Probe Microscopies: Opportunities and Issues in Metrology |
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AIP Conference Proceedings,
Volume 241,
Issue 1,
1991,
Page 547-550
E. Clayton Teague,
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PDF (201KB)
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摘要:
Projections about manufacturing trends in the integrated circuit industry are made which indicate that by 2001 uncertainty requirements for dimensional metrology will be less than 1 nanometer. Brief arguments are presented that the new scanning probe microscopies offer many opportunities to meet this need because they have the potential of reducing the uncertainty of locating a feature on a testpiece and because they provide new access to the highly‐ordered atomic structure of crystal surfaces. Such access has much potential for giving greatly increased accuracy for generating reference lines and geometry against which motion of machine elements can be measured and characterized. The need for large‐area, atomically‐flat surfaces is discussed. Opportunities for applications to metrology of frequency, mass, density, and current are also indicated. Major issues discussed are stable tip performance, robust molecular‐scaled rulers, high‐aspect ratio nonostructures and the need to integrate accurate dimensional metrology into scanning probe microscopes.
ISSN:0094-243X
DOI:10.1063/1.41401
出版商:AIP
年代:1991
数据来源: AIP
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53. |
Nanotechnology Prospects of Scanning Probes |
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AIP Conference Proceedings,
Volume 241,
Issue 1,
1991,
Page 551-552
H. G. Craighead,
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PDF (98KB)
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ISSN:0094-243X
DOI:10.1063/1.41402
出版商:AIP
年代:1991
数据来源: AIP
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54. |
Novel Measurements |
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AIP Conference Proceedings,
Volume 241,
Issue 1,
1991,
Page 553-554
P. K. Hansma,
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PDF (88KB)
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ISSN:0094-243X
DOI:10.1063/1.41403
出版商:AIP
年代:1991
数据来源: AIP
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