1. |
General considerations for a laboratory EXAFS facility |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 2-20
G. S. Knapp,
P. Georgopoulos,
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摘要:
In this paper a complete laboratory system capable of making high quality EXAFS meaurements will be described. A discussion will be given of the design of an EXAFS spectrometer, how to achieve an optimum combination of intensity and resolution, the range of energies which are practical to take EXAFS patterns, the elimination of errors caused by characteristic lines, detector systems, and the computer requirements to obtain and analyze the data. (AIP)
ISSN:0094-243X
DOI:10.1063/1.32240
出版商:AIP
年代:1980
数据来源: AIP
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2. |
An x‐ray source for a laboratory EXAFS facility |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 21-30
G. R. Fisher,
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摘要:
The design of the anode and cathode of the G×21 rotating anode system is discussed. (AIP)
ISSN:0094-243X
DOI:10.1063/1.32239
出版商:AIP
年代:1980
数据来源: AIP
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3. |
Evaluation of focusing monochromators for an EXAFS spectrometer |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 31-38
S. M. Heald,
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PDF (347KB)
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摘要:
Various focusing monocrhomators are compared and evaluated for use in an EXAFS spectrometer. For a line focus the Johann and Johansson cases are found to be most suitable. Obtaining a point focus is more difficult, with the best case appearing to be a singly bent mirror used in conjunction with the Johann or Johansson crystals.
ISSN:0094-243X
DOI:10.1063/1.32241
出版商:AIP
年代:1980
数据来源: AIP
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4. |
Detectors for laboratory EXAFS facilities |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 39-50
Edward A. Stern,
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PDF (541KB)
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摘要:
The measurement requirements for EXAFS are reviewed. Based on these requirements, various detectors are compared and evaluated for use in laboratory EXAFS facilities. Gas proportional counters and gas ionization chambers are recommended for transmission EXAFS measurements while for fluorescence measurements the gas scintillation proportional counter is best with the gas proportional counter and NaI(T1) scintillation counter close seconds.
ISSN:0094-243X
DOI:10.1063/1.32252
出版商:AIP
年代:1980
数据来源: AIP
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5. |
Laboratory EXAFS facility hardware and software |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 51-62
W. T. Elam,
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摘要:
Computer programs and interfacing at the Univ. of Washington facility are discussed. (AIP)
ISSN:0094-243X
DOI:10.1063/1.32253
出版商:AIP
年代:1980
数据来源: AIP
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6. |
Instrumental aspects of EXELFS analysis in the electron microscope |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 63-72
D. E. Johnson,
S. Csillag,
E. A. Stern,
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摘要:
Extended Energy Loss Fine Structure (EXELFS) of high energy electrons can provide the same information as EXAFS and furthermore can provide such information regarding spatially resolved low Z atoms in the laboratory setting using an electron microscope. As an example, a particular experimental configuration is described and preliminary experimental results from two model compounds are shown. The overall characteristics of EXELFS analysis in the electron microscope, including advantages and limitaions, are summaried.
ISSN:0094-243X
DOI:10.1063/1.32254
出版商:AIP
年代:1980
数据来源: AIP
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7. |
Comparison of laboratory and synchrotron radiation EXAFS facilities |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 73-83
Ruprecht Haensel,
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摘要:
Although synchrotron radiation with its unique properties as an X‐ray radiation source gave a decisive impetus to the development of EXAFS (extended X‐ray absorption fine structure) spectroscopy the increasing number of synchrotron radiation facilities is matched by a similar trend for laboratory EXAFS facilities. The mutually complementary roles of both types of facilities will be reviewed.
ISSN:0094-243X
DOI:10.1063/1.32255
出版商:AIP
年代:1980
数据来源: AIP
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8. |
Workshop on X‐ray sources |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 84-87
B. Ray Stults (Chairman),
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ISSN:0094-243X
DOI:10.1063/1.32256
出版商:AIP
年代:1980
数据来源: AIP
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9. |
Rotating anode x‐ray source |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 88-88
John Golbin,
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PDF (51KB)
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ISSN:0094-243X
DOI:10.1063/1.32228
出版商:AIP
年代:1980
数据来源: AIP
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10. |
X‐ray source for EXAFS |
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AIP Conference Proceedings,
Volume 64,
Issue 1,
1980,
Page 89-90
D. G. Hempstead,
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PDF (92KB)
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摘要:
This paper shows information presented to the sub‐group on sources at the Workship on Laboratory EXAFS Facilities April 29, 1980. Rigaku manufactures x‐ray generators in a wide range of power levels. The 1.5kW, 2kW and 3kW units are used with sealed x‐ray diffraction tubes. Rotating anode x‐ray generators are offered in 12kW, 30kW, 60kW and 90kW capacities. This paper will present information on only the 12kW Rotating Anode X‐Ray Generator, Model RU‐200.
ISSN:0094-243X
DOI:10.1063/1.32229
出版商:AIP
年代:1980
数据来源: AIP
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