摘要:

AbstractThis paper describes work on the counting of electrons in high voltage electron microscopy (HVEM). A reliable counting method is needed in order to perform quantitative experiments. A scintillator‐photomultiplier device has been adapted to these needs. It has been used here, in the field of electron energy loss spectroscopy. It permits the recording of the totality of the spectrum from the no‐loss peak to the inner shell excitation characteristic signals because of a dynamic equal to at least 7. A simple mounting has been made to eliminate the artifacts caused by X‐ray pulses. It is shown that HVEM is favourable to the counting of electrons, and some applications are rep

ISSN:0741-0581    

DOI:10.1002/jemt.1060030112

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY

ISSN:0741-0581    

DOI:10.1002/jemt.1060030101

出版商:Wiley Subscription Services, Inc., A Wiley Company    

年代:1986

数据来源: WILEY