Journal of Electron Microscopy Technique


ISSN: 0741-0581        年代:1985
当前卷期:Volume 2  issue 6     [ 查看所有卷期 ]

年代:1985
 
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1. A controlled atmosphere specimen holder for transmission electron microscopy
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  525-532

Ignatius Y. Chan,  

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2. Cross‐sectional reflection electron microscopy of III–V compound epilayers
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  533-546

B. C. De Cooman,   K.‐H. Kuesters,   C. B. Carter,  

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3. Transmission electron microscopic analysis of kidney glomeruli obtained by fine‐needle aspiration
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  547-555

Geoffrey Rowden,   Shirley Dean,   James Campbell,   Philip Belitsky,  

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4. Some characteristics of epoxy embedding resins and how they affect contrast, cell organelle size, and block shrinkage
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  557-562

Hilton H. Mollenhauer,   Robert E. Droleskey,  

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5. CTEM versus STEM versus HVEM: Evaluation of the three‐dimensional morphology of arsenic inclusions
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  563-568

R. Ramirez‐Mitchell,   E. M. B. Sorensen,  

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6. Localization of membrane‐bound and soluble antigens using peroxidase‐labeled antibodies and preembedding immunoelectron microscopy
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  569-576

R. Y. Osamura,   K. Watanabe,  

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7. A procedure to prepare cross‐sectional samples for TEM
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  577-580

Lydia Rivaud,  

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8. Identification of bacteria by studying one section under light microscopy, scanning, and transmission electron microscopy
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  581-588

F. R. Saglie,   J. C. Sa Ferreira,   C. T. Smith,   P. L. Valentin,   F. A. Carranza,   M. G. Newman,  

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9. Electron beam radiation damage to organic inclusions in ice as an analytical tool for polymer science
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  589-596

Yeshayahu Talmon,   Moshe Narkis,   Michael Silverstein,  

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10. Ultrastructural morphometric image analysis applied to estimation of condensed chromatin in normal and neoplastic lymphocytes
  Journal of Electron Microscopy Technique,   Volume  2,   Issue  6,   1985,   Page  597-609

Irving Dardick,   Alexander M. Dardick,   M. T. Diane Jeans,   Peter Rippstein,   Douglas R. Caldwell,  

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