摘要:

V-mask control schemes provide significantly better performance than Shewhart control charts for detecting small shifts of the mean from goal conditions. This paper discusses the design and use of V-mask control schemes. An extensive discussion of a practical application in the chemical industry is given.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980706

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

This paper demonstrates how the computer and multivariate statistical analysis may be linked to control many of the complex industrial processes that do not lend themselves to rigid deterministic feedback control systems.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980707

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

Through matching of OC curves of chain sampling plans with single and double sampling plans, the efficiency of chain sampling is illustrated and discussed. Operating characteristic curves for additional chain sampling plans are presented, comprising sets of ChSP-0, 3 and 1, 3 and ChSP-0, 4 and 1, 4.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980708

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

In applied regression one often examines a proposed model through residual plots. When the residuals are plotted against theX-variables or predictedY's, as generally recommended, the impression of a“horizontal band”in each plot is viewed as being in accord with the proposed model. Experimenters often plot the residuals against the observed Y's in addition and wrongly expect to see a“horizontal band”in this plot too, whereas these variables are correlated under the model. In fact, a regression of the residuals on the observed Y's is shown to have both slope,beY, and coefficient of determination,R2eY, equal to 1-R2, whereR2is the coefficient of determination for the proposed model. The plot of residuals versus observedY's does give a visual impression of the degree to which the proposed model underpredicts for largeYand overpredicts for small Y.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980709

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

In attribute sampling, product quality levels may be determined by solving the well-known binomial equation. Tables giving the quality levels for specified probabilities of lot acceptance are generated for a series of sampling plans. The importance of these tables is demonstrated through some applications in industrial quality control. Attribute sampling plans similar to Military Standard (MIL-STD) and Dodge-Romigarederived, and confidence intervals for the population proportion defective are obtained.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980710

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

The paper develops the concept of precision function for a given sample size when testing a simple hypothesis against a simple alternative hypothesis. The construction of sample size precision functions is discussed with reference to the location and scale parameters, and their use is illustrated with examples.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980711

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

摘要:

There is an obvious need that measurements in the fields of health, safety, environmental control and nuclear safeguards be adequate for their intended purpose—that their uncertainty be small enough to only negligibly affect the decisions and performance of the processes of which they are a part, but it is no less true for all other measurements in science and industry. This note discusses the procedures by which one obtains measurement assurance, the analog for measurement processes of industrial quality assurance.

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980712

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980713

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980715

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor

ISSN:0022-4065    

DOI:10.1080/00224065.1976.11980716

出版商:Taylor&Francis    

年代:1976

数据来源: Taylor