Biometrical Journal


ISSN: 0323-3847        年代:1985
当前卷期:Volume 27  issue 6     [ 查看所有卷期 ]

年代:1985
 
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1. Analysis of Profiles Based on Ordinal Classification Functions and Rank Tests
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  607-622

R. Haux,  

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2. Statistical Analysis of Data from Gene Frequency Perturbation Experiments
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  623-633

S. R. Wilson,   J. G. Oakeshott,  

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3. Pocock, S. J.: Clinical Trials — a practical approach. John Wiley&Sons, Chichester — New York — Brisbane — Toronto — Singapore 1983, 265 S., £ 16.95
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  634-634

G. Enderlein,  

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4. Scheffy's Confidence Intervals in the Models of Analysis of Covariance
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  635-644

M. Kuczyński,   T. Drwièa,  

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5. The Method of Unweighted Means in Unbalanced Analysis of Variance
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  645-652

J. D. Knoke,  

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6. Variance Component Estimation for Dichotomous Characters and Its Use for Estimating Heritability
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  653-658

V. Guiard,   G. Herrend Örfer,   A. Tuchscherer,  

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7. Fidelity Estimation for a Hierarchical Classifier
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  659-667

P. Hufnagl,   K. Voss,  

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8. Bätz, G., Dörfel, H., Fuchs, A., Thomas, E.: Einführung in die Methodik des Feld‐versuchs. Deutscher Landwirtschaftsverlag, Berlin 1982, 32, 70 M
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  668-668

G. Enderlein,  

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9. Selection of the Better of Two Treatments when They May Not be Equivalent
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  669-681

M. M. Desu,   D. R. Bristol,  

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10. Bowerman, B. L., R. T. O'Connell: Computer modeling for business and industry. Marcel Dekker, Inc., New York 1984. 232 pp., $19.95
  Biometrical Journal,   Volume  27,   Issue  6,   1985,   Page  682-682

H. Toutenburg,  

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