Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1994
当前卷期:Volume 12  issue 2     [ 查看所有卷期 ]

年代:1994
 
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11. High temperature deposition of SiN films using low pressure chemical vapor deposition system for x‐ray mask application
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  585-588

Tsuneaki Ohta,   Rakesh Kumar,   Yoshio Yamashita,   Hirosi Hoga,  

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12. Fundamental principles of phase shifting masks by Fourier optics: Theory and experimental verification
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  589-600

K. Ronse,   M. Op de Beeck,   L. Van den hove,   J. Engelen,  

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13. Tungsten trench etching in a magnetically enhanced triode reactor
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  601-604

S. V. Pendharkar,   J. C. Wolfe,  

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14. Effects of substrate temperature and angular position on the properties of ion beam sputter deposited Fe films on (100) GaAs substrates
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  605-612

S. D. Bernstein,   T. Y. Wong,   R. W. Tustison,  

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15. Selective deposition of metals on submicron resist patterns
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  613-615

J. Petermann,   T. Hoffmann,   J. Martinez‐Salazar,  

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16. Improvement in molecular‐beam epitaxy machine reliability using preventive maintenance
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  616-619

C. W. Ebert,   L. J. Peticolas,   C. L. Reynolds,   H. H. Vuong,  

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17. Optical beam‐deflection scanning force microscope with easy cantilever‐laser beam alignment
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  620-621

Kazuyoshi Sugihara,   Akira Sakai,   Tetsuo Matsuda,   Masao Toyosaki,   Kuniyoshi Tanaka,   Akira Matsuura,   Shirou Tsukada,  

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18. Arrays of gated field‐emitter cones having 0.32 μm tip‐to‐tip spacing
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  629-632

Carl O. Bozler,   Christopher T. Harris,   Steven Rabe,   Dennis D. Rathman,   Mark A. Hollis,   Henry I. Smith,  

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19. Chemical vapor deposition and plasma‐enhanced chemical vapor deposition carbonization of silicon microtips*
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  633-637

V. V. Zhirnov,   E. I. Givargizov,  

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20. Process characterization and analysis of sealed vacuum microelectronic devices
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  12,   Issue  2,   1994,   Page  638-643

Q. Mei,   S. Zurn,   D. L. Polla,  

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