Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1991
当前卷期:Volume 9  issue 2     [ 查看所有卷期 ]

年代:1991
 
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221. Imaging of single‐stranded DNA with the scanning tunneling microscope
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1285-1287

A. Cricenti,   S. Selci,   G. Chiarotti,   F. Amaldi,  

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222. A technique for stable adhesion of DNA to a modified graphite surface for imaging by scanning tunneling microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1288-1290

Yuri L. Lyubchenko,   S. M. Lindsay,   J. A. DeRose,   T. Thundat,  

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223. A method for imagingE.coli. RNA polymerase holoenzyme with the scanning tunneling microscope in an aqueous environment
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1291-1297

Rebecca W. Keller,   David Bear,   Carlos Bustamante,  

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224. Direct observation of B‐form and Z‐form DNA by scanning tunneling microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1298-1303

Min‐Qian Li,   Jin‐de Zhu,   Jie‐Qing Zhu,   Jun Hu,   Ming‐Min Gu,   Yao‐Liang Xu,   Lan‐Ping Zhang,   Ze‐Qi Huang,   Liu‐Zhong Xu,   Xiao‐Wei Yao,  

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225. Scanning tunneling microscopy of DNA: Atom‐resolved imaging, general observations and possible contrast mechanism
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1304-1308

M. G. Youngquist,   R. J. Driscoll,   T. R. Coley,   W. A. Goddard,   J. D. Baldeschwieler,  

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226. Can atomic force microscopy tips be inspected by atomic force microscopy?
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1309-1312

Louis Hellemans,   Koen Waeyaert,   Frans Hennau,   Lieve Stockman,   Ilse Heyvaert,   Chris Van Haesendonck,  

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227. Study of tip magnetization behavior in magnetic force microscope
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1313-1317

K. Sueoka,   K. Okuda,   N. Matsubara,   F. Sai,  

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228. Scanning attractive force microscope using photothermal vibration
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1318-1322

N. Umeda,   S. Ishizaki,   H. Uwai,  

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229. Electrostatic and contact forces in force microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1323-1328

Huang Wen Hao,   A. M. Baró,   J. J. Sáenz,  

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230. Atomic resolution on the surface of LiF(100) by atomic force microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  9,   Issue  2,   1991,   Page  1329-1332

E. Meyer,   H. Heinzelmann,   D. Brodbeck,   G. Overney,   R. Overney,   L. Howald,   H. Hug,   T. Jung,   H.‐R. Hidber,   H.‐J. Güntherodt,  

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