Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1988
当前卷期:Volume 6  issue 4     [ 查看所有卷期 ]

年代:1988
 
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41. Raman study of order and disorder in SiGe ultrathin superlattices
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1306-1309

J. Menéndez,   A. Pinczuk,   J. Bevk,   J. P. Mannaerts,  

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42. Electronic structure of small coverages of column III metals on silicon [100]
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1315-1319

John E. Klepeis,   Walter A. Harrison,  

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43. Electronic structure and thermal stability of Ni/SiC(100) interfaces
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1320-1325

H. Höchst,   D. W. Niles,   G. W. Zajac,   T. H. Fleisch,   B. C. Johnson,   J. M. Meese,  

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44. The formation of two aluminum–semiconductor interfaces: A temperature‐dependent study
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1326-1330

C. Stephens,   I. T. McGovern,   A. B. McLean,   W. Braun,  

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45. Soft x‐ray core level photoemission study of the Cs/InP interface formation
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1331-1335

T. Kendelewicz,   P. Soukiassian,   M. H. Bakshi,   Z. Hurych,   I. Lindau,   W. E. Spicer,  

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46. Thin‐film crystallography using reflection high‐energy electron diffraction ‘‘rod intensity profiles’’: Ni/Si(111)
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1336-1340

P. A. Bennett,   X. Tong,   J. R. Butler,  

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47. Quantum confinement and hot‐phonon effects in quantum wells
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1341-1345

M. C. Marchetti,   W. Pötz,  

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48. Optical properties of ultrathin silicon–germanium superlattices
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1346-1349

K. B. Wong,   I. Morrison,   M. Jaros,  

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49. Strained‐layer interfaces between II–VI compound semiconductors
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1350-1353

Chris G. Van de Walle,   Khalid Shahzad,   Diego J. Olego,  

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50. Band offset of the ZnSe–ZnTe superlattices: A fit to photoluminescence data byk⋅ptheory
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  6,   Issue  4,   1988,   Page  1354-1359

Y. Rajakarunanayake,   R. H. Miles,   G. Y. Wu,   T. C. McGill,  

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