Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1989
当前卷期:Volume 7  issue 4     [ 查看所有卷期 ]

年代:1989
 
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51. Scanning tunneling microscope images of native defects on the ZnSe(110) surface
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  907-909

Wei‐Min Hu,   John D. Dow,  

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52. Surface intervalley scattering on GaAs(110) studied with picosecond laser photoemission
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  910-914

R. Haight,   J. A. Silberman,  

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53. Correlation of alkali metal‐induced work function changes on semiconductor and metal surfaces
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  915-918

D. Heskett,   T. Maeda Wong,   A. J. Smith,   W. R. Graham,   N. J. DiNardo,   E. W. Plummer,  

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54. Low‐temperature alkali metal/III–V interfaces: A study of metallization and Fermi level movement
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  919-924

Renyu Cao,   K. Miyano,   T. Kendelewicz,   I. Lindau,   W. E. Spicer,  

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55. Scanning tunneling microscopy and spectroscopy of gold on the GaAs(110) surface
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  925-930

R. M. Feenstra,  

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56. Epitaxial growth of Bi on GaAs(100) surfaces
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  931-935

S. Horng,   A. Kahn,  

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57. Structural and electronic properties of Bi/GaAs(110)
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  936-944

R. Ludeke,   A. Taleb‐Ibrahimi,   R. M. Feenstra,   A. B. McLean,  

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58. Ballistic electron emission microscopy and spectroscopy of Au/GaAs interfaces
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  945-949

W. J. Kaiser,   L. D. Bell,   M. H. Hecht,   F. J. Grunthaner,  

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59. Annealing Ag on GaAs: Interplay between cluster formation and Fermi level unpinning
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  958-963

T. T. Chiang,   A. K. Wahi,   I. Lindau,   W. E. Spicer,  

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60. Coverage dependence of Schottky barrier formation
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  7,   Issue  4,   1989,   Page  964-970

John E. Klepeis,   Walter A. Harrison,  

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