Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena


ISSN: 0734-211X        年代:1996
当前卷期:Volume 14  issue 3     [ 查看所有卷期 ]

年代:1996
 
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1. Noncontact scanning force microscopy using a direct‐oscillating piezoelectric microcantilever
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1577-1581

T. Itoh,   T. Ohashi,   T. Suga,  

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2. Combined surface plasmon resonance and scanning force microscope instrument
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1582-1586

X. Chen,   M. C. Davies,   C. J. Roberts,   K. M. Shakesheff,   S. J. B. Tendler,   P. M. Williams,   J. Davies,  

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3. Atomic species identification in scanning tunneling microscopy by time‐of‐flight spectroscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1587-1590

J. C. H. Spence,   U. Weierstall,   W. Lo,  

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4. Shallow ripples with giant wavelengths observed by atomic force microscopy: Real effects and the report of a new artifact
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1591-1595

Zhenxi Dai,   Minsun Yoo,   Alex de Lozanne,  

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5. C60manipulation and cluster formation using a scanning tunneling microscope
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1596-1599

A. W. Dunn,   P. H. Beton,   P. Moriarty,  

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6. Cross‐sectional scanning tunneling spectroscopy of cleaved, silicon‐based metal–oxide–semiconductor junctions
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1607-1610

Paul M. Thibado,   T. W. Mercer,   Shelton Fu,   Takeshi Egami,   N. J. DiNardo,   Dawn A. Bonnell,  

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7. Surface structures of thermoplastic and thermoset films after modification by graft copolymerization: Comparative study by x‐ray photoelectron spectroscopy and atomic force microscopy
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1611-1620

F. C. Loh,   K. L. Tan,   E. T. Kang,   S. F. Y. Li,  

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8. Insituobservation of the tip shape of Co–Ge liquid alloy ion sources in a high‐voltage transmission electron microscope
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1621-1629

W. Driesel,   Ch. Dietzsch,   E. Hesse,   L. Bischoff,   J. Teichert,  

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9. Application of time‐resolved scanning electron microscopy to the analysis of the motion of micromechanical structures
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1630-1634

I. Ogo,   N. C. MacDonald,  

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10. Influence of Coulomb interactions on choice of magnification, aperture size, and source brightness in a two lens focused ion beam column
  Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena,   Volume  14,   Issue  3,   1996,   Page  1635-1641

P. Kruit,   X. R. Jiang,  

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