Journal of Applied Physics


ISSN: 0021-8979        年代:1974
当前卷期:Volume 45  issue 8     [ 查看所有卷期 ]

年代:1974
 
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11. Interdependence of strain, precipitation, and dislocation formation in epitaxial Se‐doped GaAs
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3277-3287

M. S. Abrahams,   J. Blanc,   C. J. Buiocchi,  

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12. Nonlinearly generated harmonics and attenuation of Rayleigh waves on crystalline quartz
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3288-3295

John W. Gibson,   Paul H. E. Meijer,  

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13. Analysis of response of pyroelectric optical detectors
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3296-3303

R. L. Peterson,   G. W. Day,   P. M. Gruzensky,   R. J. Phelan,  

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14. Kinetics of silicide formation by thin films of V on Si and SiO2substrates
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3304-3308

H. Kra¨utle,   M‐A. Nicolet,   J. W. Mayer,  

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15. Pressure and temperature dependences of the elastic constants of compression‐annealed pyrolytic graphite
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3309-3314

W. B. Gauster,   I. J. Fritz,  

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16. Cross‐sectional specimens for transmission electron microscopy
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3315-3316

M. S. Abrahams,   C. J. Buiocchi,  

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17. Ignition of hydrocarbons and the thermalization of electrical discharges
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3317-3327

E. Barreto,   S. I. Reynolds,   H. Jurenka,  

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18. Structural dependence of electrical conductivity of thin tellurium films
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3328-3331

Mumtaz A. Dinno,   Manuel Schwartz,   Beverly Giammara,  

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19. Spreading functions in secondary‐electron analysis
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3332-3336

C. A. Slocomb,   W. P. Ellis,  

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20. Electronic density of states in TiNi II and TiNi III
  Journal of Applied Physics,   Volume  45,   Issue  8,   1974,   Page  3337-3339

M. A. Mitchell,   F. E. Wang,   J. R. Cullen,  

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