Journal of Applied Physics


ISSN: 0021-8979        年代:1973
当前卷期:Volume 44  issue 7     [ 查看所有卷期 ]

年代:1973
 
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11. Defect and impurity thermodynamics in rutilelike systems
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3001-3007

John W. DeFord,   O. W. Johnson,  

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12. Experimental technique for the precise determination of H and D concentration in rutile (TiO2)
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3008-3012

O. W. Johnson,   John DeFord,   J. W. Shaner,  

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13. Twin and antiphase boundary formations in TiNi through inhomogeneous shear mechanism
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3013-3016

Frederick E. Wang,  

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14. Anomalous ultrasonic attenuation in Bi12GeO20, Bi12SiO20, and Bi12(Ge0.5Si0.5)O20
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3017-3021

Walther Rehwald,  

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15. Ionization‐enhanced diffusion: Ion implantation in semiconductors
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3022-3027

J. Bourgoin,   D. Peak,   J. W. Corbett,  

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16. X‐ray study of stacking faults in a double hexagonal close‐packed Au&sngbnd;Cd&sngbnd;In alloy
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3028-3033

Y. Babu Rao,   Shrikant Lele,   P. Rama Rao,  

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17. Acoustoelectric effect in piezodielectric semiconductor layered structure
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3034-3037

A. M. Kmita,   A. V. Medved',  

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18. Theory of infrared absorption and material failure in crystals containing inclusions
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3038-3045

M. Sparks,   C. J. Duthler,  

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19. Preparation of replicated germanium films and their applications to sensors
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3046-3051

Yoshiharu Onuma,   Yoshio Sakai,  

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20. Measurement of electron‐ion recombination rate of a dense high‐temperature cesium plasma
  Journal of Applied Physics,   Volume  44,   Issue  7,   1973,   Page  3052-3054

Che Jen Chen,   James M. Wu,   Frank T. Wu,   David T. Shaw,  

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