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101. |
GaAs&sngbnd;GaxAl1−xAs heterostructure lasers with amphoterically silicon‐doped active regions |
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Journal of Applied Physics,
Volume 44,
Issue 1,
1973,
Page 529-530
F. H. Doerbeck,
D. M. Blacknall,
R. L. Carroll,
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摘要:
Amphoterically silicon‐doped GaAs heterostructure lasers were fabricated using solution epitaxial growth of GaAs and GaAlAs in a sliding boat system. LOC lasers and double‐heterostructure lasers were obtained. The emission wavelength was between 9040 and 9250 Å. Threshold current densities were typically 12–4 kA cm−2, with 2.4 kA cm−2as the lowest value observed with a double heterostructure.
ISSN:0021-8979
DOI:10.1063/1.1661932
出版商:AIP
年代:1973
数据来源: AIP
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102. |
Variation of dc domain threshold in a nematic liquid crystal under continual dynamic scattering |
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Journal of Applied Physics,
Volume 44,
Issue 1,
1973,
Page 531-531
F. E. Wargocki,
A. E. Lord,
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摘要:
Data are presented indicating a change in threshold for domain formation in MBBA as a function of time maintained under dc dynamic scattering. These changes are correlated with observed changes in dielectric constant.
ISSN:0021-8979
DOI:10.1063/1.1661933
出版商:AIP
年代:1973
数据来源: AIP
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103. |
A new class of switching materials |
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Journal of Applied Physics,
Volume 44,
Issue 1,
1973,
Page 532-533
F. Bueche,
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摘要:
By combining several volume percent of conducting particles in a semicrystalline matrix, a highly temperature‐dependent resistivity is obtained. The resistivity changes by several orders of magnitude in a small temperature interval centered on the crystal melting temperature. Moreover, a typical resistivity changes by a factor of hundreds as the frequency changes from 102to 104Hz. Materials of this type show dielectric constants in excess of 103which vary strongly with temperature and frequency.
ISSN:0021-8979
DOI:10.1063/1.1661934
出版商:AIP
年代:1973
数据来源: AIP
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104. |
Calculated elastic constants for stress problems associated with semiconductor devices |
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Journal of Applied Physics,
Volume 44,
Issue 1,
1973,
Page 534-535
W. A. Brantley,
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摘要:
Theoretical estimates or experimental determinations of stress fields associated with semiconductor devices are generally simplified with the aid of two elastic constants, Young's modulusEand Poisson's ratio &ngr;. In this paper, a generalized expression for &ngr; has been derived for arbitrary orientations of cubic semiconductor crystals, and the variation ofE, &ngr;, andE/(1‐&ngr;) for directions within the important {111}, {100}, and {110} planes is examined. The results show that isotropic elasticity theory is exact for all directions within {111} planes and that the composite elastic constantE/(1‐&ngr;) which frequently occurs in problems of practical interest is also invariant for all directions within {100} planes. Numerical values for the various elastic constants are tabulated for GaAs, GaP, Si, and Ge.
ISSN:0021-8979
DOI:10.1063/1.1661935
出版商:AIP
年代:1973
数据来源: AIP
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105. |
Erratum: Profile estimation of high‐concentration arsenic diffusion in silicon |
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Journal of Applied Physics,
Volume 44,
Issue 1,
1973,
Page 536-536
R. B. Fair,
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ISSN:0021-8979
DOI:10.1063/1.1661938
出版商:AIP
年代:1973
数据来源: AIP
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