摘要:

This paper reviews the theory of low angle x‐ray diffraction as applied in the long wavelength region for the determination of particle sizes and shapes and other structural features in the submicroscopic size range and emphasizes the advantages to be gained by employing the longer x‐ray wavelengths (8 to 25 A). It also is intended to serve as an introduction to a description of an entirely new instrumental technique developed for this long wavelength range utilizing a diffraction apparatus consisting of a special gas‐filled x‐ray tube and a total reflection camera in which the primary radiation is simultaneously monochromatized and made to converge to a point focus. The sample for study is placed in the converging part of the primary beam and the diffraction patterns are formed around the point focus on a photographic film.

ISSN:0021-8979    

DOI:10.1063/1.1722117

出版商:AIP    

年代:1955

数据来源: AIP

ISSN:0021-8979    

DOI:10.1063/1.1722119

出版商:AIP    

年代:1955

数据来源: AIP

ISSN:0021-8979    

DOI:10.1063/1.1722121

出版商:AIP    

年代:1955

数据来源: AIP