Journal of Applied Physics


ISSN: 0021-8979        年代:1980
当前卷期:Volume 51  issue 8     [ 查看所有卷期 ]

年代:1980
 
     Volume 51  issue 1   
     Volume 51  issue 2   
     Volume 51  issue 3   
     Volume 51  issue 4   
     Volume 51  issue 5   
     Volume 51  issue 6   
     Volume 51  issue 7   
     Volume 51  issue 8
     Volume 51  issue 9   
     Volume 51  issue 10   
     Volume 51  issue 11   
     Volume 51  issue 12   
21. Detection of latent scratches and swirl on silicon wafers by scanned surface photoresponse
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4115-4118

Dale E. Hill,  

Preview   |   PDF (394KB)

22. Ion implantation of sulfur in Cr‐doped InP at room temperature
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4119-4124

J. Kasahara,   J. F. Gibbons,   T. J. Magee,   J. Peng,  

Preview   |   PDF (351KB)

23. Damage profile determination of ion‐implanted Si layers by ellipsometry
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4125-4129

T. Motooka,   K. Watanabe,  

Preview   |   PDF (306KB)

24. Ion‐implanted Se in GaAs
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4130-4138

A. Lidow,   J. F. Gibbons,   V. R. Deline,   C. A. Evans,  

Preview   |   PDF (568KB)

25. Furnace annealing behavior of phosphorus implanted, laser annealed silicon
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4139-4144

Masanobu Miyao,   Kazuo Itoh,   Masao Tamura,   Hiroshi Tamura,   Takashi Tokuyama,  

Preview   |   PDF (412KB)

26. Elastic interaction of ⟨111⟩ defects and extended screw dislocation in anisotropic fcc crystals
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4145-4149

V. R. Parameswaran,   M. S. Bapna,  

Preview   |   PDF (341KB)

27. An annealing study of electron irradiation‐induced defects in GaAs
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4150-4157

D. Pons,   A. Mircea,   J. Bourgoin,  

Preview   |   PDF (633KB)

28. Variation of secondary ion emission yield with atomic concentrations of Fe, Ni, and Cr ternary alloys and oxides: Application to the analysis of thin oxide films
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4158-4163

J. C. Pivin,   C. Roques‐Carmes,   G. Slodzian,  

Preview   |   PDF (425KB)

29. The effects of irradiation and electrodiffusion on the sodium acoustic loss peak in synthetic quartz
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4164-4168

S. P. Doherty,   J. J. Martin,   A. F. Armington,   R. N. Brown,  

Preview   |   PDF (353KB)

30. Experimental and theoretical study of the equation of state of carbon using an intense beam of relativistic electrons
  Journal of Applied Physics,   Volume  51,   Issue  8,   1980,   Page  4169-4177

C. Peugnet,   M. Roche,   P. de Villers,   C. Savy,   G. Sibille,  

Preview   |   PDF (500KB)

首页 上一页 下一页 尾页 第3页 共99条