Journal of Applied Physics


ISSN: 0021-8979        年代:1961
当前卷期:Volume 32  issue 11     [ 查看所有卷期 ]

年代:1961
 
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21. Transparency of Glass and Certain Plastics under Shock Attack
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2421-2424

H. Dean Mallory,   William S. McEwan,  

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22. Determination of Field Strength for Field Evaporation and Ionization in the Field Ion Microscope
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2425-2428

Erwin W. Mu¨ller,   Russell D. Young,  

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23. X‐Ray Measurement of Stacking Fault Widths in fcc Metals
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2428-2431

B. E. Warren,  

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24. (110) Nickel Surface
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2432-2439

L. H. Germer,   A. U. MacRae,   C. D. Hartman,  

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25. Production of High Ion Densities in Helium by Means of High Explosives
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2439-2447

G. E. Seay,   L. B. Seely,   R. G. Fowler,  

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26. Magnetization Curve of an Infinite Cylinder
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2448-2450

M. W. Muller,   A. Wehlau,  

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27. Effects of Transition Metal Solutes on the Electrical Resistivity of Copper and Gold Between 4° and 1200°K
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2450-2456

C. A. Domenicali,   E. L. Christenson,  

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28. Interrelation of Electronic Properties and Defect Equilibria in PbTe
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2457-2465

E. Miller,   K. Komarek,   I. Cadoff,  

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29. Determination of Certain Spectral Distributions of Soft X Rays by Theoretical Analysis of Absorption Experiments
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2465-2474

Nancy A. Kerr,  

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30. Forbidden Reflections in Electron Diffraction Patterns of Evaporated Tin Films
  Journal of Applied Physics,   Volume  32,   Issue  11,   1961,   Page  2474-2475

Richard W. Vook,  

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