Journal of Applied Physics


ISSN: 0021-8979        年代:1979
当前卷期:Volume 50  issue 3     [ 查看所有卷期 ]

年代:1979
 
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21. Doping and electrical properties of Mg in LPE AlxGa1−xAs
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1304-1307

Seiji Mukai,   Yunosuke Makita,   Shun‐ichi Gonda,  

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22. Electron‐beam annealing of ion‐implantation damage in integrated‐circuit devices
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1308-1311

T. I. Kamins,   P. H. Rose,  

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23. Contrast of a stacking fault in x‐ray section topography study of the Laue‐Bragg case
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1312-1317

Y. Epelboin,  

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24. Electrical profiles of magnesium‐ion‐implanted GaP
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1318-1324

David J. Lank,   B. C. Dobbs,   Y. S. Park,  

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25. The independent fourth‐order elastic coefficients for the trigonal and hexagonal symmetry classes
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1325-1327

Xanthippi Markenscoff,  

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26. A critical evaluation of equations of state by piezo‐optic measurements
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1328-1333

K. Vedam,   Pichet Limsuwan,  

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27. Continuum basis for diffusion in regions with multiple diffusivity
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1334-1338

Elias C. Aifantis,  

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28. Measurement of grain‐boundary diffusion at low temperatures by the surface accumulation method. I. Method and analysis
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1339-1348

J. C. M. Hwang,   R. W. Balluffi,  

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29. Measurement of grain‐boundary diffusion at low temperature by the surface‐accumulation method. II. Results for gold‐silver system
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1349-1359

J. C. M. Hwang,   J. D. Pan,   R. W. Balluffi,  

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30. Temperature‐compensated surface‐acoustic‐wave devices with SiO2film overlays
  Journal of Applied Physics,   Volume  50,   Issue  3,   1979,   Page  1360-1369

T. E. Parker,   H. Wichansky,  

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