摘要:

Techniques which are particularly useful for magnetic investigations involving thin films and small particles are reviewed. Measurements of torque are discussed from an instrument point of view and from a measurement point of view, including those measurements such asMr, Ms, and &Dgr;90which are peculiar to thin films. Extensions to the standard loop tracer method that are necessary to investigate thin films include a very sensitive integrator, a very slow drive, and the extra coils for measuring &agr;90and &Dgr;90. For fast flux reversal, the equipment is outlined and various methods of taking data are discussed. Optical techniques involving the Kerr magneto‐optic technique are reviewed along with the use of the electron microscope for both Lorentz and Bitter pattern transfer observations.

ISSN:0021-8979    

DOI:10.1063/1.1709686

出版商:AIP    

年代:1967

数据来源: AIP