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41. |
Calculation of the image potential in multiple layered structures |
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Journal of Applied Physics,
Volume 58,
Issue 12,
1985,
Page 4740-4742
A. G. O’Neill,
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PDF (188KB)
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摘要:
Calculations of the image potential of a point charge in three‐layer systems reported previously in the literature are cumbersome. A much simpler method is presented here, by treating the system like a classical optical system where rays of light are replaced by rays of electric flux.
ISSN:0021-8979
DOI:10.1063/1.336225
出版商:AIP
年代:1985
数据来源: AIP
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42. |
Generalized reciprocity theorem for semiconductor devices |
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Journal of Applied Physics,
Volume 58,
Issue 12,
1985,
Page 4743-4744
K. Misiakos,
F. A. Lindholm,
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PDF (163KB)
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摘要:
A reciprocity theorem is presented that relates the short‐circuit current of a device, induced by a carrier generation source, to the minority‐carrier Fermi level in the dark. The basic relation is general under low injection. It holds for three‐dimensional devices with position dependent parameters (energy gap, electron affinity, mobility, etc.), and for transient or steady‐state conditions. This theorem allows calculation of the internal quantum efficiency of a solar cell by using the analysis of the device in the dark. Other applications could involve measurements of various device parameters, interfacial surface recombination velocity at a polycrystalline silicon emitter contact, for example, by using steady‐state or transient photon or mass‐particle radiation.
ISSN:0021-8979
DOI:10.1063/1.336226
出版商:AIP
年代:1985
数据来源: AIP
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