| 51. |
Role of the Competing Etching Process in Determining the Quality of Pyrolytically Grown Silicon and Germanium Films |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1358-1359
E. G. Bylander,
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ISSN:0021-8979
DOI:10.1063/1.1713628
出版商:AIP
年代:1964
数据来源: AIP
|
| 52. |
Penetration of Water into Plastically Deformed NaCl |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1359-1360
A. T. Kellogg,
R. O. Pohl,
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ISSN:0021-8979
DOI:10.1063/1.1713629
出版商:AIP
年代:1964
数据来源: AIP
|
| 53. |
Nondestructive Method for Revealing Stacking Faults in Epitaxial Silicon |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1360-1361
R. H. Dudley,
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ISSN:0021-8979
DOI:10.1063/1.1713630
出版商:AIP
年代:1964
数据来源: AIP
|
| 54. |
Superconductivity in the High‐Pressure InSb‐Beta‐Sn System |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1361-1362
Susan D. Nye,
Mario D. Banus,
Harry C. Gatos,
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ISSN:0021-8979
DOI:10.1063/1.1713631
出版商:AIP
年代:1964
数据来源: AIP
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| 55. |
Defect Structures on Polished Quartz Surfaces as Seen by X‐Ray Diffraction Microscopy |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1362-1363
J. B. Newkirk,
J. D. Young,
J. P. Spencer,
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ISSN:0021-8979
DOI:10.1063/1.1713632
出版商:AIP
年代:1964
数据来源: AIP
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| 56. |
Ultrasonic Relaxation Loss in OH‐Free SiO2 |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1363-1363
R. E. Strakna,
H. T. Savage,
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ISSN:0021-8979
DOI:10.1063/1.1713633
出版商:AIP
年代:1964
数据来源: AIP
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| 57. |
Erratum: Laue Patterns and Zone Structure in Bi2Te3 |
| |
Journal of Applied Physics,
Volume 35,
Issue 4,
1964,
Page 1364-1364
H. H. Soonpaa,
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ISSN:0021-8979
DOI:10.1063/1.1713634
出版商:AIP
年代:1964
数据来源: AIP
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