61. |
Evidence for mixed clusters formed during sulfur hexafluoride expansions in an argon carrier gas |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6419-6421
Sang Soo Kim,
Gilbert D. Stein,
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摘要:
Nucleation of sulfur hexafluoride in an argon carrier gas has been studied in very small supersonic adiabatic nozzle expansions. Light scattering is used to detect the onset of condensation, and high‐energy electron diffraction is used to ascertain cluster structure for a range of operating conditions where mixed clusters and/or binary nucleation can occur. For the limited range in SF6mole fraction, &khgr;0=0.01 to 0.03, both the thermodynamic and cluster diffraction data indicate that the SF6nucleates homogeneously with Ar accruing onto the condensed SF6after the Ar supersaturates.
ISSN:0021-8979
DOI:10.1063/1.327590
出版商:AIP
年代:1980
数据来源: AIP
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62. |
Vidicon target of ap‐i‐nstructure usinga‐Si:H |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6422-6423
Isamu Shimizu,
Shunri Oda,
Keishi Saito,
Eiichi Inoue,
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摘要:
A vidicon target of ap‐i‐nstructure has been fabricated using amorphous silicon prepared by a rf glow discharge of silane (SiH4). A thin layer ofn‐typea‐silicon doped with phosphorus was provided between a photosensitive layer and a substrate coated with a transparent electrode (SnO2:Sb) to prohibit injection of holes. An excellent photoresponse was attained for visible light.
ISSN:0021-8979
DOI:10.1063/1.327591
出版商:AIP
年代:1980
数据来源: AIP
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63. |
Compound formation between amorphous silicon and chromium |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6424-6425
B.G. Yacobi,
A.J. Szadkowski,
S. Zukotynski,
J.M. Corbett,
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摘要:
The reaction between evaporated amorphous silicon films and chromium layers was studied using transmission electron microscopy and both transmission electron diffraction and reflection electron diffraction. Whena‐Si and Cr films were deposited in the same pumpdown, the formation of CrSi2was observed at temperatures as low as 400 °C. No reaction was observed whena‐Si was deposited on electrodeposited Cr.
ISSN:0021-8979
DOI:10.1063/1.327592
出版商:AIP
年代:1980
数据来源: AIP
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64. |
The generation of electron‐hole pairs in very thin solar cells possessing an optical back‐surface reflector |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6426-6428
Oldwig von Roos,
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摘要:
It is pointed out that very thin solar cells (1 &mgr;m thick or less) as, for example, amorphous silicon or cadmium sulfide cells, possessing a back‐surface reflector should be regarded as Fabry‐Perot cavities as far as the generation of electron‐hole pairs by light is concerned. The generation rate of electron‐hole pairs as a function of distance from the front surface exhibits characteristic interference patterns which are not negligible and must be accounted for in an analysis of the performance of such a cell.
ISSN:0021-8979
DOI:10.1063/1.327593
出版商:AIP
年代:1980
数据来源: AIP
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65. |
Recombination mechanisms in amorphous silicon‐based alloys |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6429-6431
D. Adler,
M. Silver,
A. Madan,
W. Czubatyj,
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摘要:
Photoconductivity has been measured as a function of temperature, photon energy, and electric field strength for amorphous Si:F:H alloys. The results clearly show that geminate recombination is not important in the visible region of the spectrum in these materials. The significance of these results for efficient solar photovoltaic energy conversion is discussed.
ISSN:0021-8979
DOI:10.1063/1.327594
出版商:AIP
年代:1980
数据来源: AIP
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66. |
Bias‐dependent photoluminescence intensities inn‐InP Schottky diodes |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6432-6434
Koushi Ando,
Akio Yamamoto,
Masafumi Yamaguchi,
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摘要:
A remarkable change of the photoluminescence (PL) intensity with the variation of the dc bias voltage is observed in Au/n‐InP Schottky surface. It is found from the observation of the surface band bending that the PL intensity is dominantly affected by the surface space‐charge layer. The maximum PL intensity is found to be attained at the flat‐band bias condition.
ISSN:0021-8979
DOI:10.1063/1.327595
出版商:AIP
年代:1980
数据来源: AIP
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67. |
Removal of the high‐resistivity layer at thenonn+liquid phase epitaxial GaAs layer‐substrate interface by controlledinsituetch‐back |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6435-6437
Alan C. Seabaugh,
Robert J. Mattauch,
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摘要:
A high‐resistivity layer often forms at the gallium arsenide layer‐substrate interface following preepitaxial growth heat treatment and subsequent layer growth. Aninsituetch‐back technique was developed for use on the substrate which resulted in the removal of the high‐resistivity interfacial layer. This simple technique yielded reproducible etch‐back versus time control and thus controllable removal of the high‐resistivity layer.
ISSN:0021-8979
DOI:10.1063/1.327596
出版商:AIP
年代:1980
数据来源: AIP
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68. |
Validity of the resistively shunted Josephson junction model for small‐area superconductor‐normal‐superconductor junctions in a magnetic field |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6438-6440
S. E. Barnes,
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摘要:
A theoretical study of small superconductor‐normal‐superconductor Josephson junctions shows that while low‐critical‐current junctions do obey the resistively shunted junction model (RSJM), large‐current‐density junctions do not and are thereby much less sensitive to strong magnetic fields than the RSJM equivalent.
ISSN:0021-8979
DOI:10.1063/1.327597
出版商:AIP
年代:1980
数据来源: AIP
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69. |
An improved technique for selective etching of GaAs and Ga1−xAlxAs |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6441-6442
J. J. LePore,
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摘要:
An improved technique is described for selectively etching ’’windows’’ in GaAs crystals with Ga1−xAlxAs (0.30⩽x⩽ 0.80) epitaxial layers. A reduction factor of 10–50 in the sample preparation time is achieved with a good reproducibility.
ISSN:0021-8979
DOI:10.1063/1.327598
出版商:AIP
年代:1980
数据来源: AIP
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70. |
High‐performance amorphous‐silicon field‐effect transistors |
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Journal of Applied Physics,
Volume 51,
Issue 12,
1980,
Page 6443-6444
Masakiyo Matsumura,
Yasuo Nara,
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摘要:
p‐channel andn‐channel amorphous‐silicon field‐effect transistors with thermally grown SiO2as a gate insulator have been investigated. On‐off current ratios of 4×106and 105were obtained forn‐ andp‐channel modes, respectively, and the electron and hole mobilities were about 0.1 and 2×10−3cm2/V/s, respectively.
ISSN:0021-8979
DOI:10.1063/1.327599
出版商:AIP
年代:1980
数据来源: AIP
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