Journal of Applied Physics


ISSN: 0021-8979        年代:1980
当前卷期:Volume 51  issue 4     [ 查看所有卷期 ]

年代:1980
 
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71. The electron effective mass in In1−xGaxAsyP1−y
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2277-2278

J. B. Restorff,   Bland Houston,   R. S. Allgaier,   M. A. Littlejohn,   Sunil B. Phatak,  

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72. Short derivation of the influence of particle size ratio on the conductivity threshold in binary aggregates
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2279-2280

Jay Janzen,  

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73. Electrical resistivity and galvanomagnetic properties of evaporated nickel films
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2281-2285

C. K. Ghosh,   A. K. Pal,  

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74. Barrier heights of evaporated metal contacts on Zn3P2
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2286-2288

N. Convers Wyeth,   A. Catalano,  

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75. The effect of a capacitance inI‐Vcharacteristics in small superconducting tunnel junctions with high‐frequency radiations
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2289-2291

Masao Koyanagi,   Tadashi Endo,   Akira Nakamura,   Tadayuki Matsui,  

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76. Quantum noise effects in tunnel junctions in the 0–1‐mV bias range
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2292-2293

A. van der Ziel,  

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77. Effect of resonance linewidth on the insertion loss of a periodically corrugated YIG film
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2294-2296

Ming‐Chi Tsai,   S. R. Seshadri,  

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78. Donor‐acceptor‐type complex in GaAs—Further comment
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2297-2300

P. J. Dean,   D. C. Herbert,  

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79. Determination of carrier concentration and compensation microprofiles in GaAs
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2301-2303

L. Jastrzebski,   J. Lagowski,   W. Walukiewicz,   H. C. Gatos,  

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80. Cathodoluminescence observation of SiO2layers in a semiconductor device
  Journal of Applied Physics,   Volume  51,   Issue  4,   1980,   Page  2304-2305

H. Koyama,  

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