Journal of Applied Physics


ISSN: 0021-8979        年代:1990
当前卷期:Volume 67  issue 11     [ 查看所有卷期 ]

年代:1990
 
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81. Sum rule for multiple scattering of light by neighboring dielectric spheres
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7147-7148

Tuan W. Chen,  

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82. Growth of Al oxide layers on GaAs (100) by reaction with condensed molecular oxygen
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7148-7151

Y. Gao,   C. P. Lusignan,   M. W. Ruckman,   Myron Strongin,  

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83. Formation of buried SiO2layer by oxygen implanted into Si/Ge and Si/Si0.5Ge0.5substrates
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7151-7153

Y. S. Tang,   Jingping Zhang,   P. L. F. Hemment,   B. J. Sealy,   Hengda Liu,   J. E. Castle,   S. M. Newstead,   A. R. Powell,   T. E. Whall,   E. H. C. Parker,  

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84. Interaction of a permanent magnet with a superconducting hollow cylinder
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7154-7156

Peter J. Wojtowicz,  

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85. Strain relaxation and alloying effects in the GaAs/In0.52Al0.48As/InP(100) heterostructure
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7157-7159

M. D. Williams,   T. Y. Chang,   D. D. Nolte,  

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86. Sequential power transfer between stripes of a diode laser array via photorefractive two‐wave mixing in BaTiO3
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7160-7162

S. MacCormack,   R. W. Eason,  

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87. Dependence of the photorefractive properties of KTa1−xNbxO3:Cu,V on Cu valence state concentration
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7162-7165

Victor Leyva,   Aharon Agranat,   Amnon Yariv,  

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88. Characterization of high‐purity InP by photoluminescence
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7165-7168

T. Inoue,   K. Kainosho,   R. Hirano,   H. Shimakura,   T. Kanazawa,   O. Oda,  

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89. Noncontact minority‐carrier lifetime measurement at elevated temperatures for metal‐doped Czochralski silicon crystals
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7168-7171

F. Shimura,   T. Okui,   T. Kusama,  

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90. Analysis of tilt in the high‐strain‐rate pressure‐shear plate impact experiment
  Journal of Applied Physics,   Volume  67,   Issue  11,   1990,   Page  7171-7173

Richard W. Klopp,   Rodney J. Clifton,  

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