81. |
Sum rule for multiple scattering of light by neighboring dielectric spheres |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7147-7148
Tuan W. Chen,
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摘要:
It is pointed out that the eikonal scheme suggests a powerful sum rule which relates the end‐on light scattering by a system ofNdielectric spheres to scattering by a single sphere. The sum rule is tested numerically for two dielectric spheres and shown to work for wide ranges of size parameter and refractive index.
ISSN:0021-8979
DOI:10.1063/1.344540
出版商:AIP
年代:1990
数据来源: AIP
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82. |
Growth of Al oxide layers on GaAs (100) by reaction with condensed molecular oxygen |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7148-7151
Y. Gao,
C. P. Lusignan,
M. W. Ruckman,
Myron Strongin,
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摘要:
An Al oxide‐GaAs (100) interface fabricated by the reactive deposition of Al into a molecular oxygen overlayer on a gallium terminated GaAs (100) surface atT=49 K is studied by synchrotron radiation photoemission. Al forms a stable oxide layer by reaction with O2until all the oxygen is consumed. Limited oxidation of surface As atoms (≊20%) is observed during the initial deposition of Al, but further Al deposition reduces the AsO bond. The well‐known exchange reaction between Al and Ga when Al is directly deposited on GaAs (100) is not observed.
ISSN:0021-8979
DOI:10.1063/1.344541
出版商:AIP
年代:1990
数据来源: AIP
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83. |
Formation of buried SiO2layer by oxygen implanted into Si/Ge and Si/Si0.5Ge0.5substrates |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7151-7153
Y. S. Tang,
Jingping Zhang,
P. L. F. Hemment,
B. J. Sealy,
Hengda Liu,
J. E. Castle,
S. M. Newstead,
A. R. Powell,
T. E. Whall,
E. H. C. Parker,
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摘要:
The formation of buried SiO2layer by high‐dose oxygen implanted into Si/Ge and Si/Si0.5Ge0.5heterostructures is studied by infrared transmission and x‐ray photoelectron spectroscopy. The results show that the Ge in the implanted region has no influence on the bonding properties of oxygen, and there exists a critical annealing temperature of about 1250 °C for all the implanted oxygen to be bonded as SiO2.
ISSN:0021-8979
DOI:10.1063/1.344542
出版商:AIP
年代:1990
数据来源: AIP
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84. |
Interaction of a permanent magnet with a superconducting hollow cylinder |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7154-7156
Peter J. Wojtowicz,
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摘要:
The Meissner‐effect interaction of a small permanent magnet with a superconducting hollow cylinder has been investigated by solving the Laplace equation numerically using a finite‐difference method. The calculations reveal the existence of stable equilibrium configurations for a range of shapes and sizes of the cylinder. The computed magnitude of the Hooke’s law force constant is close to those measured for small magnets levitated above superconducting disks.
ISSN:0021-8979
DOI:10.1063/1.344543
出版商:AIP
年代:1990
数据来源: AIP
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85. |
Strain relaxation and alloying effects in the GaAs/In0.52Al0.48As/InP(100) heterostructure |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7157-7159
M. D. Williams,
T. Y. Chang,
D. D. Nolte,
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摘要:
Insitusurface sensitive photoemission spectroscopy has been used to study the evolution of the strained layer GaAs/In0.52Al0.48As heterostructure as the GaAs overlayer is grown past the critical layer thickness in sequential steps by molecular‐beam epitaxy. The variation in spectral features evident in the GaAs valence band is inconsistent with predictions of tight binding theory for strain relaxation. An analysis of the core level spectra suggests that In out‐diffusion is responsible for the valence band modification.
ISSN:0021-8979
DOI:10.1063/1.344544
出版商:AIP
年代:1990
数据来源: AIP
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86. |
Sequential power transfer between stripes of a diode laser array via photorefractive two‐wave mixing in BaTiO3 |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7160-7162
S. MacCormack,
R. W. Eason,
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摘要:
We report the transfer of 48% of the incident power from a semiconductor laser array into a diffraction‐limited beam by means of photorefractive coherent beam combination in BaTiO3, using a progressive two‐wave mixing geometry. A single‐element, photorefractive beam combiner is described which should allow the transfer of 88% of the power of a suitable array into a single diffraction‐limited beam.
ISSN:0021-8979
DOI:10.1063/1.344545
出版商:AIP
年代:1990
数据来源: AIP
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87. |
Dependence of the photorefractive properties of KTa1−xNbxO3:Cu,V on Cu valence state concentration |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7162-7165
Victor Leyva,
Aharon Agranat,
Amnon Yariv,
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摘要:
Absorption measurements and electron microprobe analysis are used to determine the density of Cu1+and Cu2+ions in a photorefractive KTa1−xNbxO3:Cu,V sample. Photorefractive measurements are made over a wide range of Cu1+and Cu2+concentrations, altered by a series of oxidation and reduction treatments. Diffraction efficiencies were varied by over an order of magnitude while erasure rates were varied by over two orders of magnitude.
ISSN:0021-8979
DOI:10.1063/1.344546
出版商:AIP
年代:1990
数据来源: AIP
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88. |
Characterization of high‐purity InP by photoluminescence |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7165-7168
T. Inoue,
K. Kainosho,
R. Hirano,
H. Shimakura,
T. Kanazawa,
O. Oda,
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摘要:
InP polycrystals grown by the HB technique and InP single crystals grown by the liquid‐encapsulated Czochralski technique have been evaluated by photoluminescence. It was found that as the carrier concentration is decreased, the photoluminescence spectrum shows finer structures. When the carrier concentration is less than 9×1014cm−3, a strong free‐exciton peak could be observed.
ISSN:0021-8979
DOI:10.1063/1.344547
出版商:AIP
年代:1990
数据来源: AIP
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89. |
Noncontact minority‐carrier lifetime measurement at elevated temperatures for metal‐doped Czochralski silicon crystals |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7168-7171
F. Shimura,
T. Okui,
T. Kusama,
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摘要:
Minority‐carrier recombination lifetimes have been extensively measured with a noncontact laser/microwave method for metal‐dopedp‐type Czochralski silicon crystals in the temperature range from room temperature to 250 °C. The contrasting behavior of the lifetime as a function of temperature is shown for Fe‐ and Cr‐doped silicon crystals. Iron doping greatly shortens the lifetime in the entire temperature range. Although Cr doping also greatly shortens at room temperature, the degradation effect completely disappears at elevated temperatures. Doping the Na, Ni, Cu, and W shows little effect on lifetime; Na doping results in a rather higher lifetime compared with that of undoped silicon. Moreover, lifetime measurement as a function of holding time at an elevated temperature clearly distinguishes uncontaminated silicon from metal‐doped silicon.
ISSN:0021-8979
DOI:10.1063/1.344548
出版商:AIP
年代:1990
数据来源: AIP
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90. |
Analysis of tilt in the high‐strain‐rate pressure‐shear plate impact experiment |
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Journal of Applied Physics,
Volume 67,
Issue 11,
1990,
Page 7171-7173
Richard W. Klopp,
Rodney J. Clifton,
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摘要:
An analysis is presented of the effect of tilt in the high‐strain‐rate pressure‐shear plate impact experiment. Normal and shear tractions and the velocity difference across the specimen are obtained from free‐surface particle velocity, tilt angle, closure direction, and impact velocity data. The effect of tilt in high‐strain‐rate pressure‐shear plate impact is shown to be small unless the velocity difference across the specimen is itself small.
ISSN:0021-8979
DOI:10.1063/1.344549
出版商:AIP
年代:1990
数据来源: AIP
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