91. |
Deep level transient spectroscopy study inn‐type InP |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3317-3320
H. Lim,
G. Sagnes,
G. Bastide,
M. Rouzeyre,
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摘要:
This paper reports the results of a Deep Level Transient Spectroscopy (DLTS) study on 14 InP diodes fabricated from five different crystals. From 16 observed DLTS peaks and corresponding Arrhenius plots, seven (or eight) trapping levels have been identified whose characteristics are as follows: Trapping levels CharacteristicsE1= 210 meVS1= 3×10−16cm2E2= 190 mevS2= 7×10−19cm2E3= 330 meVS3= 4×10−16cm2E4= 500 meVS4= 2×10−12cm2E5= 410 mevS5= 1×10−16cm2E6= 630 meVS6= 2×10−14cm2E7= 330 meVS7= 5×10−14cm2
ISSN:0021-8979
DOI:10.1063/1.330991
出版商:AIP
年代:1982
数据来源: AIP
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92. |
Moderate mobility enhancement in single period AlxGa1−xAs/GaAs heterojunctions with GaAs on top |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3321-3323
H. Morkoc¸,
T. J. Drummond,
R. Fischer,
A. Y. Cho,
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摘要:
Selectively doped single period AlxGa1−xAs/GaAs heterojunctions with the GaAs layer on top of AlxGa1−xAs were prepared by molecular beam epitaxy. Moderate electron mobility enhancement was achieved when the samples were grown near a substrate surface temperature of 700 °C. Samples grown well below and well above 700 °C did not show observable mobility enhancement. The samples grown at 700 °C and with an electron concentration of 1017cm−3exhibited 300 K mobilities of about 4 500 cm2/Vs and 78 K mobilities of 8500 cm2/Vs, which is about a factor of 2 higher than that of bulk GaAs at 78 K. To our knowledge, this is the first report of mobility enhancement in these inverted single period AlxGa1−xAs/GaAs heterostructures.
ISSN:0021-8979
DOI:10.1063/1.330992
出版商:AIP
年代:1982
数据来源: AIP
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93. |
Comment on ’’Simulation of high‐field transport in GaAs using a Monte Carlo method and pseudopotential band structures’’ and on ’’Band‐structure dependent transport and impact ionization in GaAs’’ |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3324-3326
F. Capasso,
T. P. Pearsall,
K. K. Thornber,
R. E. Nahory,
M. A. Pollack,
G. B. Bachelet,
J. R. Chelikowsky,
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摘要:
Recent theoretical work by Shichijo, Hess, and Stillman on a Monte Carlo simulation of high‐field transport and impact ionization in GaAs is examined. The failure of that calculation to reproduce the experimentally well‐documented orientation dependence of impact ionization can be directly related to the use of a phonon scattering rate that is unrealistically high. It is shown that such high scattering rates lead, by the uncertainty principle to a large collisional broadening (?0.3 to 0.6 eV) of the conduction band, thus invalidating the Monte Carlo simulation and rendering questionable any attempt to relate transport to the band structure. The important role played by the avalanche region width in the orientation dependence of impact ionization is also discussed.
ISSN:0021-8979
DOI:10.1063/1.330993
出版商:AIP
年代:1982
数据来源: AIP
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94. |
Reply to ’’Comment on ’Simulation of high‐field transport in GaAs using a Monte Carlo method and pseudopotential band structures’ and on ’Band‐structure dependent transport and impact ionization in GaAs’ ’’ |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3327-3329
K. Hess,
J. Y. Tang,
K. Brennan,
H. Shichijo,
G. E. Stillman,
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摘要:
Using semiclassical Monte Carlo simulations and the band structure as calculated by the empirical pseudopotential method, we show that the electron‐phonon scattering rate in GaAs exceeds 1014s−1. As a consequence, impact ionization of ballistic (lucky) electrons becomes extremely unlikely. The objections of Capassoetal. to our treatment are discussed in detail and shown to be physically of minor importance.
ISSN:0021-8979
DOI:10.1063/1.330994
出版商:AIP
年代:1982
数据来源: AIP
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95. |
Effect of electron‐electron scattering on mobility in GaAs |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3330-3332
D. Chattopadhyay,
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摘要:
The influence of electron‐electron scattering on mobility in GaAs is studied over the temperature range 80–300 K using the variation principle. The mobilities limited by both polar optic and ionized impurity scattering are reduced more significantly due to electron‐electron scattering than those limited by deformation potential acoustic and by piezoelectric scattering. For a carrier concentration of 1016cm−3, the overall mobility is reduced by about 10% at 80 K.
ISSN:0021-8979
DOI:10.1063/1.330995
出版商:AIP
年代:1982
数据来源: AIP
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96. |
Back surface field and vertical solar cell |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3333-3334
Yu‐Tung Yang,
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摘要:
Experiments show that a region of back surface field is also a region of strong light‐to‐electric‐power conversion capability.
ISSN:0021-8979
DOI:10.1063/1.330996
出版商:AIP
年代:1982
数据来源: AIP
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97. |
Spectral response of ac photoconductivity in Zn3P2 |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3335-3338
Faa‐Ching Wang,
Richard H. Bube,
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摘要:
ac (80 Hz) photoconductivity spectral response curves have been measured for seven single crystal samples of Zn3P2prepared by different preparation techniques and subjected to different heat and surface treatments prior to measurement over the spectral range from 0.6 to 1.2 &mgr;m. Surface ac photoconductivity lifetimes range from 0.4 to 40 &mgr;sec, and bulk ac photoconductivity lifetimes range from 3 to 100 &mgr;sec. Major contributions to the photoconductivity near the band edge of Zn3P2come from transitions of about 1.41 and 1.52 eV, probably corresponding to direct transitions from the two higher‐lying valence bands split by spin‐orbit and crystal fields.
ISSN:0021-8979
DOI:10.1063/1.330997
出版商:AIP
年代:1982
数据来源: AIP
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98. |
Metal‐insulator‐semiconductor diodes fabricated on InP, InGaAsP, and InGaAs |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3339-3341
Takeshi Kobayashi,
Yukinobu Shinoda,
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摘要:
The compositional dependence of In1−xGaxAsyP1−y(y= 2.2x) MIS (metal‐insulator‐semiconductor) diodeC‐Vcharacteristics was investigated for entire As fraction range (0⩽y⩽1). As the gate insulator, the pyrolytic Al2O3film was employed. Alln‐type MIS diodes fabricated on InP, In0.76Ga0.24As0.55P0.45and In0.53Ga0.47As showed almost entire capacitance variation between the accumulation and high‐frequency inversion capacitances. The compositional dependence of theC‐Vcurve was clearly seen in its hysteresis and the surface state density distribution. TheC‐Vcurve hysteresis becomes less pronounced as the crystal composition is closer to InGaAs. The botton of the V‐shaped surface state density distribution shifts toward the conduction band edge as As fraction (y) increases. Therefore, the surface state density near the conduction band edge was reduced to 1012/cm2eV, compared to the value 1013/cm2eV at InP surface.
ISSN:0021-8979
DOI:10.1063/1.330998
出版商:AIP
年代:1982
数据来源: AIP
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99. |
IrSi1.75a new semiconductor compound |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3342-3343
S. Petersson,
J. A. Reimer,
M. H. Brodsky,
D. R. Campbell,
F. d’Heurle,
B. Karlsson,
P. A. Tove,
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摘要:
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon werep‐type with a charge carrier density of the order of 4×1017cm−3.
ISSN:0021-8979
DOI:10.1063/1.330999
出版商:AIP
年代:1982
数据来源: AIP
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100. |
Effect of nonparabolicity on amplification of surface phonons in piezoelectric semiconductor films |
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Journal of Applied Physics,
Volume 53,
Issue 4,
1982,
Page 3344-3346
Chhi‐Chong Wu,
Jensen Tsai,
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摘要:
The effect of nonparabolicity on the amplification of surface phonons in piezoelectric semiconductor films is investigated quantum mechanically in the GHz frequency region. Numerical results are obtained for ann‐type GaAs epitaxial layer on a semi‐insulating GaAs substrate at 77 °K. Results show that the amplification is enhanced for the nonparabolic band structure due to the nonlinear nature of the energy band in semiconductors.
ISSN:0021-8979
DOI:10.1063/1.331000
出版商:AIP
年代:1982
数据来源: AIP
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