Journal of Applied Physics


ISSN: 0021-8979        年代:1952
当前卷期:Volume 23  issue 7     [ 查看所有卷期 ]

年代:1952
 
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1. Completeness Relations for Loss‐Free Microwave Junctions
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  701-710

T. Teichmann,  

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2. Methods of Measuring the Properties of Ionized Gases at High Frequencies. I. Measurements ofQ
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  711-718

Sanborn C. Brown,   David J. Rose,  

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3. Methods of Measuring the Properties of Ionized Gases at High Frequencies. II. Measurement of Electric Field
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  719-722

David J. Rose,   Sanborn C. Brown,  

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4. The Initial Conduction Interval in High Speed Thyratrons
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  722-724

James B. Woodford,   Everard M. Williams,  

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5. On Diffusionless Transformation in Au‐Cd Single Crystals Containing 47.5 Atomic Percent Cadmium: Characteristics of Single‐Interface Transformation
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  725-728

Lo‐Ching Chang,  

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6. Specimen Charging in the Electron Microscope and Some Observations on the Size of Polystyrene Latex Particles
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  728-732

S. G. Ellis,  

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7. Theory of Wave‐Guide‐Fed Slots Radiating into Parallel‐Plate Regions
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  733-737

Harry Gruenberg,  

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8. On the Evaluation of Noise Samples
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  737-742

Arnold J. F. Siegert,  

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9. The Admittance of a Diode with a Retarding Field
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  743-745

J. J. Freeman,  

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10. The Creep of Zinc Single Crystals
  Journal of Applied Physics,   Volume  23,   Issue  7,   1952,   Page  746-753

L. Slifkin,   W. Kauzmann,  

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