1. |
Mass Spectrometer as an Industrial Tool |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 525-525
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ISSN:0021-8979
DOI:10.1063/1.1714906
出版商:AIP
年代:1942
数据来源: AIP
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2. |
A Short History of Isotopes and the Measurement of Their Abundances |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 526-538
E. B. Jordan,
Louis B. Young,
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PDF (734KB)
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ISSN:0021-8979
DOI:10.1063/1.1714907
出版商:AIP
年代:1942
数据来源: AIP
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3. |
Measurement of Relative Abundance with the Mass Spectrometer |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 539-550
E. B. Jordan,
N. D. Coggeshall,
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PDF (615KB)
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摘要:
This paper covers the general methods employed in mass spectrometry, machine design, and possible sources of error in relative‐abundance measurements which are inherently associated with instrument design. Also included are graphs for determining the critical constants of the usual types of instruments.
ISSN:0021-8979
DOI:10.1063/1.1714908
出版商:AIP
年代:1942
数据来源: AIP
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4. |
Gas Analysis with the Mass Spectrometer |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 551-560
John A. Hipple,
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ISSN:0021-8979
DOI:10.1063/1.1714909
出版商:AIP
年代:1942
数据来源: AIP
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5. |
Some Applications of Mass Spectrometric Analysis to Chemistry |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 561-569
D. Rittenberg,
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PDF (618KB)
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ISSN:0021-8979
DOI:10.1063/1.1714910
出版商:AIP
年代:1942
数据来源: AIP
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6. |
A Diffraction Adapter for the Electron Microscope |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 571-577
J. Hillier,
R. F. Baker,
V. K. Zworykin,
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摘要:
An adapter has been developed which allows a conventional electron microscope to be used interchangeably as an electron diffraction camera or an electron microscope. The adapter comprises a unit which takes the place of the projection lens unit of the microscope, and includes a newly designed microscope projection lens, a specimen holder, and a focusing lens. To transform the instrument from a microscope to a diffraction camera (or vice versa) it is necessary only to transfer the specimen from the regular object chamber to the adapter. Diffraction patterns may be obtained by either reflection or transmission. As a result of the excellent reproducibility of voltages and currents from the regulated power supplies used in the electron microscope, the diffraction camera holds its calibration to within 0.1 percent over long periods. Using a calibration determined by measurements of gold patterns, lattice spacings of a number of common materials were determined and found to agree with x‐ray values to within 0.5 percent.
ISSN:0021-8979
DOI:10.1063/1.1714911
出版商:AIP
年代:1942
数据来源: AIP
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7. |
The Reflection of Electromagnetic Waves from a Parabolic Friction‐Free Ionized Layer |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 577-581
Olof E. H. Rydbeck,
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ISSN:0021-8979
DOI:10.1063/1.1714912
出版商:AIP
年代:1942
数据来源: AIP
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8. |
Variation of the Axial Aberrations of Electron Lenses with Lens Strength |
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Journal of Applied Physics,
Volume 13,
Issue 9,
1942,
Page 582-594
E. G. Ramberg,
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PDF (658KB)
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摘要:
The variation of refractive power and spherical aberration with electrode voltages and field strengths is studied for two characteristic unipotential lenses, an immersion lens, and a magnetic lens. Conclusions are drawn herefrom regarding the variation, with lens strength and applied voltage, of the resolving power obtainable with the lens as an electron‐microscope objective. Scattered measurements by other authors agree satisfactorily with the results. The ``relativistic aberration'' of the electrostatic unipotential lenses, i.e., the effect on the image of fluctuations in the over‐all applied voltage, is calculated and shown to be of significance in the electrostatic electron microscope. Furthermore, the axial chromatic aberrations are computed for the four systems and the question of upper limits of the last two aberrations is discussed.
ISSN:0021-8979
DOI:10.1063/1.1714913
出版商:AIP
年代:1942
数据来源: AIP
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