Journal of Applied Physics


ISSN: 0021-8979        年代:1950
当前卷期:Volume 21  issue 9     [ 查看所有卷期 ]

年代:1950
 
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1. The Thickness Measurement of Thin Films by Multiple Beam Interferometry
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  843-846

G. D. Scott,   T. A. McLauchlan,   R. S. Sennett,  

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2. Distribution in Energy of Johnson Noise Pulses
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  847-850

Ben R. Gossick,  

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3. Note on the Use of Reiner's Equation for Recognition of Pseudoplastics from Their Flow Curves
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  850-852

Vera Osman Krakauer,  

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4. An X‐Ray Study of Thermally Induced Stresses in Microconstituents of Aluminum‐Silicon Alloys
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  853-854

John P. Nielsen,   Walter R. Hibbard,  

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5. X‐Ray Diffraction by Elastically Deformed Crystals
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  855-859

J. E. White,  

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6. Some Effects of Nozzle Design on the Diffraction of Electrons by Gases
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  860-874

R. B. Harvey,   F. A. Keidel,   S. H. Bauer,  

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7. Studies with an Aerodynamically Instrumented Shock Tube
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  874-878

A. Hertzberg,   A. Kantrowitz,  

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8. The Magnetostriction of Permanent Magnet Alloys
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  879-889

E. A. Nesbitt,  

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9. Improved Ultra‐Thin Sectioning of Tissue for Electron Microscopy
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  889-895

James Hillier,   Mark E. Gettner,  

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10. Reflection and Transmission of Electromagnetic Waves by Thin Curved Shells
  Journal of Applied Physics,   Volume  21,   Issue  9,   1950,   Page  896-901

Joseph B. Keller,  

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