Journal of Applied Physics


ISSN: 0021-8979        年代:1982
当前卷期:Volume 53  issue 4     [ 查看所有卷期 ]

年代:1982
 
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1. Electron backscattering from thin films
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  15-49

H. Niedrig,  

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2. An alternate way of looking at maser noise
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2783-2784

A. van der Ziel,  

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3. Sensing characteristics of SnO2thin film gas sensor
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2785-2787

Takashi Oyabu,  

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4. Magnetic behavior of metal hydrides as a function of hydrogen pressure and composition
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2788-2792

Masuhiro Yamaguchi,   Takehiko Katamune,   Tokio Ohta,  

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5. Measurements of the photoelastic and elastic constants of drawn films and extruded rods of polypropylene with Brillouin light scattering
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2793-2799

David B. Cavanaugh,   C. H. Wang,  

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6. The field induced in a conducting sphere placed in a steady magnetic field and a perpendicular oscillatory magnetic field
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2800-2805

W. N. Hugrass,  

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7. Magnetic blocking direct recovery efficiency for intense neutral beams
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2806-2810

J. H. Whealton,   J. W. Wooten,   R. W. McGaffey,  

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8. Primary ion tetrode optics for high transparency multibeamlet neutral injectors
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2811-2817

J. H. Whealton,  

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9. Repetitive operation of an inductively‐driven electron‐beam diode
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2818-2824

B. Fell,   R. J. Commisso,   V. E. Scherrer,   Ihor Vitkovitsky,  

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10. Light reflection from randomly oriented convex particles with rough surface
  Journal of Applied Physics,   Volume  53,   Issue  4,   1982,   Page  2825-2830

R. Schiffer,   K. O. Thielheim,  

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