Journal of Applied Physics


ISSN: 0021-8979        年代:1955
当前卷期:Volume 26  issue 2     [ 查看所有卷期 ]

年代:1955
 
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1. Measurement of Microwave Diffraction from a Long Slit in a Thin Conducting Plane
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  135-137

Jay L. Hirshfield,   Clayton M. Zieman,  

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2. Backscattering from Wide‐Angle and Narrow‐Angle Cones
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  138-151

Leopold B. Felsen,  

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3. Diffraction by Apertures
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  151-165

Chaang Huang,   Ralph D. Kodis,   Harold Levine,  

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4. Relation of Antimony Transmission and the Photoelectric Yield of Cs&sngbnd;Sb
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  166-169

Martin Rome,  

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5. Spin‐Echo Memory Device
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  170-181

Sidney Fernbach,   Warren G. Proctor,  

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6. Theory of Elasticity and Consolidation for a Porous Anisotropic Solid
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  182-185

M. A. Biot,  

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7. Radiation of Plasma Noise from Arc Discharge
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  185-189

T. Takakura,   K. Baba,   K. Nunogaki,   H. Mitani,  

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8. Measurement of Carrier Lifetimes in Germanium and Silicon
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  190-195

Donald T. Stevenson,   Robert J. Keyes,  

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9. Short‐Time Frequency Measurement of Narrow‐Band Random Signals by Means of a Zero Counting Process
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  195-201

Herbert Steinberg,   Peter M. Schultheiss,   Conrad A. Wogrin,   Felix Zweig,  

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10. Internal Friction of Metal Single Crystals
  Journal of Applied Physics,   Volume  26,   Issue  2,   1955,   Page  202-210

Johannes Weertman,  

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