ISSN:0021-8979    

DOI:10.1063/1.1707485

出版商:AIP    

年代:1944

数据来源: AIP

摘要:

IN the October, 1943 issue of this Journal, an early history of the new American Institute of Physics building was published which created widespread interest and favorable comment. Further articles were promised so that physicists could become better acquainted with their new headquarters. A second article of this series, one devoted to the architectural features of the house is presented below.‐The Editor.

ISSN:0021-8979    

DOI:10.1063/1.1707486

出版商:AIP    

年代:1944

数据来源: AIP

ISSN:0021-8979    

DOI:10.1063/1.1707488

出版商:AIP    

年代:1944

数据来源: AIP

ISSN:0021-8979    

DOI:10.1063/1.1707489

出版商:AIP    

年代:1944

数据来源: AIP

摘要:

In this paper a study is made of the forced torsional oscillations of an elastic half‐space, the physical constants of which are assumed to be known, under the action of a rigid circular disk oscillating periodically about an axis through its center. A method is also given for the determination of the shear modulus of the half‐space through a study of its torsional oscillations.

ISSN:0021-8979    

DOI:10.1063/1.1707490

出版商:AIP    

年代:1944

数据来源: AIP

ISSN:0021-8979    

DOI:10.1063/1.1707491

出版商:AIP    

年代:1944

数据来源: AIP

摘要:

An asymptotic method is given for computing the lowest frequencies of multi‐disk systems having a large number of disks. It is based on the assumption that the frequency to be computed can be represented approximately by a descending series in the disk number and that the form of the leading term of this series can be obtained by inspection of the frequency equation. The method is tried out on three examples, all six‐cylinder Diesel engines.

ISSN:0021-8979    

DOI:10.1063/1.1707492

出版商:AIP    

年代:1944

数据来源: AIP

摘要:

The RCA diffraction adapter for its electron microscopes uses a weak magnetic lens to focus the diffraction patterns. The accuracy of the results obtained in electron diffraction analysis with such a system is discussed, and it is shown that lattice spacings may be determined with an accuracy of one percent if reasonable precautions are observed in calibration and operation of the instrument. A method is also described for measuring the accelerating voltage of the electrons from data obtained from the diffraction pattern. Electron diffraction patterns are shown of a number of thin film materials which are commonly used as specimen supports in electron diffraction analyses and electron microscopy. The effects of aging and beam exposure on the patterns produced by these films are determined.

ISSN:0021-8979    

DOI:10.1063/1.1707493

出版商:AIP    

年代:1944

数据来源: AIP