Particle&Particle Systems Characterization


ISSN: 0934-0866        年代:1996
当前卷期:Volume 13  issue 5     [ 查看所有卷期 ]

年代:1996
 
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1. Editorial
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  268-268

K. Leschonski,  

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2. We just can't keep a good thing to ourselves!
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  269-269

F. Durst,  

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3. Correction of the Effect of Particle Shape on the size distribution measured with a laser diffraction instrument
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  271-279

Camiel M. G. Heffels,   Peter J. T. Verheijen,   Daniel Heitzmann,   Brian Scarlett,  

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4. Laser Diffraction – Unlimited?
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  280-286

Wolfgang Witt,   Stephan Rüthele,  

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5. Size Measurement of Small Magnetic Particles
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  287-290

Andreja Sešelj,  

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6. Global Analysis of Dynamic Light Scattering Autocorrelation Functions
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  291-294

Stephen W. Provencher,   Petr Štêpánek,  

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7. Particle Shape Investigations with a light‐scattering optical instrument
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  295-300

Thomas Neeße,   Johann Dück,   Thomas Thaufelder,  

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8. In‐line Particle Size Analysis in the fines outlet of an air classifier
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  301-308

Michael Heuer,   Dieter Schwechten,  

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9. On‐line Determination of Particle Size Distribution during the manufacture of compound feed
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  309-312

Eberhard Heidenreich,   Thomas Sundermeier,  

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10. Barium Sulfate Precipitation: Crystallization kinetics and the role of the additive PMA‐PVS
  Particle&Particle Systems Characterization,   Volume  13,   Issue  5,   1996,   Page  313-321

Michiel A. van Drunen,   Henk G. Merkus,   Brian Scarlett,   Gerda M. van Rosmalen,  

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