|
21. |
System for transferring samples between chambers in UHV |
|
Journal of Vacuum Science and Technology,
Volume 15,
Issue 5,
1978,
Page 1756-1760
T. Fleisch,
A. T. Shepard,
T. Y. Ridley,
W. E. Vaughn,
N. Winograd,
W. E. Baitinger,
G. L. Ott,
W. N. Delgass,
Preview
|
PDF (4603KB)
|
|
摘要:
This system provides right angle or end‐on transfer of a sample holder from one chamber to another at ultrahigh‐vacuum conditions. A convenient mechanical coupling and uncoupling device and magnetically driven transfer rods allow movement of the sample‐holder assembly over distances up to 150 cm. The room‐temperature holder accommodates two samples. The heatable assembly includes contacts for resistive heating of the sample to temperatures above 1800 K and thermocouple reading of sample temperatures.
ISSN:0022-5355
DOI:10.1116/1.569840
出版商:American Vacuum Society
年代:1978
数据来源: AIP
|
22. |
Kinetics data for diffusion of outgassing species from RTV 560 silicone rubber |
|
Journal of Vacuum Science and Technology,
Volume 15,
Issue 5,
1978,
Page 1761-1768
C. K. Liu,
A. P. M. Glassford,
Preview
|
PDF (1268KB)
|
|
摘要:
A detailed analytical and experimental study has been made of the outgassing behavior of RTV 560 silicone rubber. Outgassing rate measurements were made by collection of outgassed species on a cooled quartz crystal microbalance (QCM). The four outgassing species which predominate in the temperature range of 285 to 425 K have been separately identified. The initial concentration of these species in the parent material has been determined, while the diffusion coefficients and activation energy for diffusion of the two major species have been deduced from outgassing rate data. It is shown that using these data in a diffusion theory model, the outgassing rates of these major species can be predicted for arbitrary sample thickness, and for any temperature within the range studied.
ISSN:0022-5355
DOI:10.1116/1.569841
出版商:American Vacuum Society
年代:1978
数据来源: AIP
|
23. |
Resolution factors in the use of a double‐pass CMA for ISS |
|
Journal of Vacuum Science and Technology,
Volume 15,
Issue 5,
1978,
Page 1769-1770
W. P. Ellis,
T. N. Taylor,
Preview
|
PDF (264KB)
|
|
摘要:
A double‐pass CMA with a 90° ion gun is limited for ISS by the angular‐dependent ion scattering energies. A 90°±2.3° aperture mask significantly improves the peak resolution for He+/Au to 2% in ΔE/Efrom 7% in the unmasked mode. Although surface compositions of Ni/Cu alloys were still not resolvable with Ne+, Cu(amu 63.5) is separable from Fe(56) and As(75). As an adjunct to UPS studies, using the same analyzer, this approach is a valuable, additional capability .
ISSN:0022-5355
DOI:10.1116/1.569842
出版商:American Vacuum Society
年代:1978
数据来源: AIP
|
24. |
Clean source of metallic Zr for ultrahigh vacuum surface studies |
|
Journal of Vacuum Science and Technology,
Volume 15,
Issue 5,
1978,
Page 1771-1772
P. R. Davis,
H. R. Poppa,
Preview
|
PDF (706KB)
|
|
ISSN:0022-5355
DOI:10.1116/1.569843
出版商:American Vacuum Society
年代:1978
数据来源: AIP
|
|