61. |
Abstract: Paper-Tape Controlled Electron Probe Exposure of Resist for Microelectronic Applications |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1131-1131
C. Dix,
W. C. Nixon,
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ISSN:0022-5355
DOI:10.1116/1.1318500
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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62. |
Abstract: Nanoelectronic Project and Astec Logic |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1132-1132
J. E. Picquendar,
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ISSN:0022-5355
DOI:10.1116/1.1318505
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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63. |
Investigation of the Sensitivity of Ionization-Type Vacuum Gauges |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1133-1139
Raymond Holanda,
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摘要:
A quantitative analysis of a large and representative sample of available data has been made to determine the best criteria for predicting the relative sensitivities of ionization-type vacuum gauges to different gases. The molecular property of the gas that correlates best with relative sensitivity is the ionization cross section σ (eV). The best σ value to choose according to gauge type is as follows: 1. For high-pressure ionization gauges, a σ evaluated at23of the accelerating potential of the gauge is the best choice. 2. For Bayard-Alpert and triode gauges, any of three choices are of approximately equal value. These are 100 eV σ values, maximum σ value for each gas, and a σ evaluated at23of the accelerating potential for each gauge. 3. For the Alphatron gauge, σ values in the range 5000–10 000 eV provide the best correlation. 4. For cold cathode ionization gauges, insufficient data were available to come to any conclusions.
ISSN:0022-5355
DOI:10.1116/1.1318508
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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64. |
A Simple Method of Calculating the Effectiveness of High Temperature Radiation Heat Shields |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1140-1143
Kimo M. Welch,
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摘要:
A method is given whereby one may graphically determine the radiation heat transfer properties of a number of closely packed radiation shields. The method uses the gray body formula, taking into account variations in total thermal emissivity of the adjacent shields as a function of temperature. Results were used in the construction of a high temperature vacuum furnace. Excellent correlation was found between graphically predicted and calorimetrically measured results.
ISSN:0022-5355
DOI:10.1116/1.1318509
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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65. |
Glow Discharge Optical Spectroscopy for Monitoring Sputter Deposited Film Thickness |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1144-1149
J. E. Greene,
F. Sequeda-Osorio,
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摘要:
Glow discharge optical spectroscopy was used as a technique for monitoring the rate of sputtering and the rate of film deposition. It was determined that within the pressure and voltage range of these experiments the product of the electroluminescent emission intensity of a given sputtered target species in the discharge and the time of sputtering is linearly proportional to both the change in mass of the target and the final thickness of the deposited film. In the case of compound targets, the emission intensity from either constituent can be monitored. The emission signal was shown to be generated primarily in a narrow region directly in front of the target.
ISSN:0022-5355
DOI:10.1116/1.1318510
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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66. |
Analysis of Gas Mixtures Using Data from Pulsed Vacuum Networks |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1150-1152
Robert Pulfrey,
B. R. F. Kendall,
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摘要:
A numerical method for extracting gas mixture compositions from pulsed vacuum network data is discussed. The problem of imposing boundary conditions is considered. Results of the analysis of several artificial gas mixtures are presented.
ISSN:0022-5355
DOI:10.1116/1.1318511
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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67. |
The Deposition of Single CrystalCaF2Films on Rocksalt Substrates in Various Orientations |
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Journal of Vacuum Science and Technology,
Volume 10,
Issue 6,
1973,
Page 1153-1153
K. Reichelt,
M. Rey,
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ISSN:0022-5355
DOI:10.1116/1.1318512
出版商:American Vacuum Society
年代:1973
数据来源: AIP
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