DOI:10.1049/ree.1976.0001

出版商:IERE    

年代:1976

数据来源: IET

摘要:

The first part of this review describes, in terms intended for the general reader, the physical basis of amorphous semiconductors and their use in switching devices. The second part is devoted to a more critical appraisal of current thinking on conduction and switching mechanisms and recent advances in the technology and applications of amorphous semiconductor devices.

DOI:10.1049/ree.1976.0002

出版商:IERE    

年代:1976

数据来源: IET

摘要:

Two simple techniques are described for the design of recursive digital filters in the cascade configuration, which minimize the coefficient word-length. These are intended for cases where a statistical treatment is not valid because of the coarseness of quantization.The derivation of the discrete set of pole positions for the basic second-order section in the form of az-plane pole grid is reviewed. This concept is fundamental to both techniques. They have been implemented by means of interactive operation on a small computer, but the more sophisticated technique, which is a form of one-at-a-time optimization, could be organized as a batchprocessed algorithm.

DOI:10.1049/ree.1976.0003

出版商:IERE    

年代:1976

数据来源: IET

摘要:

Based on radiometeorological observations at 2 GHz and 120 MHz over two co-located transhorizon tropospheric propagation paths in Northern India during 1971, this paper describes the propagation characteristics and analyses the mechanisms of propagation at 2 GHz. Correlation of hourly median signal with refractivity gradient was found to be good while correlation with surface refractivity was much poorer. Evidence is presented to show that scattering was responsible for weaker values of observed signal, reflexion for intermediate signal levels which include the long-term median, while the guided mode was responsible for the higher levels of observed signal.

DOI:10.1049/ree.1976.0004

出版商:IERE    

年代:1976

数据来源: IET

摘要:

An introduction to the effects of light on semiconductor devices and their use in testing integrated circuits is given. The possibilities are discussed of utilizing a focused laser beam as a minute, movable, non-destructive probe. This may be used to feed information into integrated circuits, to locate and simulate faults, and to shorten the time required to test these circuits. Experiments performed have shown that a few microwatts of laser beam power can switch internal nodes in m.o.s. digital circuits in less than a microsecond. By using an appropriately modulated beam binary sequences have been injected in a similar manner. The beam was also used to determine the minority carrier diffusion length in m.o.s. digital circuits.

DOI:10.1049/ree.1976.0005

出版商:IERE    

年代:1976

数据来源: IET

DOI:10.1049/ree.1976.0006

出版商:IERE    

年代:1976

数据来源: IET