| 1. |
Editorial |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 5-5
Walter M. Haney,
Edward F. Reidy,
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PDF (150KB)
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ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00478.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 2. |
Aptitude (Intelligence) Testing: Past, Present, and Future |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 6-6
Eric F. Gardner,
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PDF (75KB)
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摘要:
An introduction to the NCME invited symposium “A Tribute to the Late Roger Lennon
ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00479.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 3. |
Some Contributions of the College Board SAT to Psychometric Theory and Practice |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 7-11
William H. Angoff,
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PDF (712KB)
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摘要:
The author describes the evolution of one of the nation's best‐known standardized tests–the Scholastic Aptitude Test. He describes some of the contributions to educational research made by inquiries based on the SAT and gives particular attention to the way scaling and equating procedures for the SAT have evolved over the last half cent
ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00480.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 4. |
The Otis and Otisennon Tests: Their Contributions |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 12-18
Michael D. Beck,
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PDF (1013KB)
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摘要:
After tracing the development of the Otis test series from 1918 to the present, the author argues that there will be a continuing demand for group‐administered general mental ability tests in education. Nevertheless, he foresees a need for better ways of relating ability test scores with skills and achievements to make them more educationally usefu
ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00481.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 5. |
The Future of Intelligence Testing |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 19-22
Robert J. Sternberg,
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PDF (687KB)
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摘要:
Though the most widely used “intelligence” tests have changed little in the last half century, Dr. Stern‐berg predicts a variety of new influences of future intelligence testing, ranging from the ways we conceptualize intelligence, to the manner in which we pose problems to asse
ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00482.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 6. |
Signs of Optimism for Intelligence Testing |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 23-24
Lee J. Cronbach,
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PDF (263KB)
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ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00483.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 7. |
Comments on Angof's “Some Contributions of the College Board SAT…” |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 25-25
Robert Thorndike,
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PDF (90KB)
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ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00484.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 8. |
Remarks on Three Papers |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 26-26
John C. Flanagan,
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PDF (408KB)
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ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00485.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 9. |
1986 Annual Meeting Highlights |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 28-28
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PDF (389KB)
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ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00486.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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| 10. |
Book Review |
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Educational Measurement: Issues and Practice,
Volume 5,
Issue 3,
1986,
Page 29-29
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PDF (174KB)
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摘要:
The Basics of Item Response Theory, Frank Baker
ISSN:0731-1745
DOI:10.1111/j.1745-3992.1986.tb00487.x
出版商:Blackwell Publishing Ltd
年代:1986
数据来源: WILEY
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