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1. |
Computer simulation of negative-resistance oscillators using a Monte-Carlo model of gallium arsenide |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 97-104
Robert A.Warriner,
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摘要:
A gallium arsenide diode structure is simulated using a particle-mesh computer model. The model incorporates two dimensions in configuration space, and three dimensions ink-space, with a full description of the material scattering cross-section, which is implemented using Monte-Carlo techniques. Detailed information about electric field and valley population profiles is presented for both dipole domain, and l.s.a. modes of operation. Comparison is made with the widely differing previous theoretical results.
DOI:10.1049/ij-ssed.1977.0012
出版商:IEE
年代:1977
数据来源: IET
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2. |
Computer simulation of gallium arsenide field-effect transistors using Monte-Carlo methods |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 105-110
Robert A.Warriner,
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PDF (771KB)
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摘要:
A gallium arsenide planar field-effect transistor (f.e.t.) structure is simulated using a particle-mesh computer model. The model incorporates two dimensions in configuration space and three dimensions ink-space; with a full description of the material scattering cross-section which is implemented using Monte-Carlo techniques. The f.e.t. static characteristic has been calculated together with the lumped equivalent-circuit paramters. A comparison is made between devices with and without substrate. Detailed information about electrostatic potential and valley population profiles is presented for the first time. Cole-Cole plots of complex output impedance are used in determining device frequency response.
DOI:10.1049/ij-ssed.1977.0013
出版商:IEE
年代:1977
数据来源: IET
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3. |
Time-of-flight measurement of electron drift velocity and longitudinal diffusion coefficient in nitrogen, carbon monoxide, carbon dioxide and hydrogen |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 111-116
H.T.Saelee,
J.Lucas,
J.W.Limbeek,
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PDF (604KB)
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摘要:
The drift velocity and longitudinal diffusion coefficient have been obtained for electrons from measurements of the transit time of a pulsed electron swarm across a uniform electric field gap. Values have been obtained for electrons in nitrogen, carbon monoxide, carbon dioxide and hydrogen for high values ofE/N(the ratio of electric field to gas number density) in the range 28 ≤E/N≤ 706 Td (1 Td = 10−21Vm2)
DOI:10.1049/ij-ssed.1977.0014
出版商:IEE
年代:1977
数据来源: IET
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4. |
Unusually thin Dayem bridges as Q-band mixers |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 117-120
P.K.D.Froome,
A.H.Beck,
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PDF (522KB)
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摘要:
Josephson junctions using Dayem bridges made from unusually thin films have been operated as mixers. The thickness of the film was made small to increase the r.f. impedance of the device and so to improve r.f. matching, but such thin films often fail to act as Josephson junctions because of surface roughness. In the device reported here, attempts were made to obtain specular reflection of the electron wave functions from the surface. Our devices behaved as good Josephson junctions and gave an internal mixing efficiency of 4.5% at 32 GHz.
DOI:10.1049/ij-ssed.1977.0015
出版商:IEE
年代:1977
数据来源: IET
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5. |
Design of c.c.d. delay lines with floating-gate taps |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 121-129
P.B.Denyer,
J.Mavor,
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摘要:
Multitapped c.c.d. analogue delay lines have been produced with the floating-gate, reset-sensing technique. Although the efficacy of the approach has been demonstrated, no comprehensive design procedure exists to enable systematic device design. Because the c.c.d. and its associated tapping circuitry is an active structure, the operational parameter relationships are extremely complex and dependent on many physical effects. Some of these individual processes have been previously associated with a particular operating parameter, but, usually, for a nontapped device configuration. This paper summarises the basic performance limiting processes of floating-gate tapped c.c.d. delay lines, and presents a quantitative basis for designs and also for further analytical studies. In particular, 3-phase surface-channel devices are considered, although the analyses may be extended to other c.c.d. formations. The equations presented are related to a simple design example based upon a specification achievable in practical devices.
DOI:10.1049/ij-ssed.1977.0016
出版商:IEE
年代:1977
数据来源: IET
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6. |
Simple method of determining the large-signal negative resistance of baritt diodes |
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IEE Journal on Solid-State and Electron Devices,
Volume 1,
Issue 4,
1977,
Page 130-132
S.Ahmad,
J.Freyer,
M.Claassen,
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PDF (334KB)
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摘要:
A new method is presented for the determination of the large-signal negative resistance of baritt diodes. The simplicity is emphasised in terms of the ususal current/voltage characteristic measurements required. The diodes can thus be characterised, under actual operation conditions, in a microwave circuit, with the help of the present method.
DOI:10.1049/ij-ssed.1977.0017
出版商:IEE
年代:1977
数据来源: IET
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